MBIST---PATR1
时间: 2023-09-27 09:12:16 浏览: 184
At-Speed Interconnect Test and Diagnosis of External Memories on a System
MB是指内存内置自检测,即Memory Built-in Self Test。它是一种在芯片设计中常用的技术,用于测试内存的正确性和可靠性。MBIST的PATR1是指MBIST的第一个部分,其中包含了TAP、TMB、BAP、SIB和Mem Interface等组件。TAP是指ijtag相关内容,是一个标准接口;TMB是Mem bist controller,包含了做mem test的所有的信号的generator,可控制多块mem;BAP是bist access port,提供控制信号给到TMB,收集TMB中的GO/DONE信号;SIB是Segment insertion bit,类似一个开门的钥匙,用于信号shift和update,增加灵活性;而Mem Interface则是mem controller和mem之间的接口,用于数据之间的传递。在MBIST的PATR1中,TMB包含了FSM,通过控制信号来进行配置和控制测试过程,同时还有信号生成和数据比对的功能。MBIST的PATR1的设计中,COMP组件在MEM interface中和TMB中都存在,具体如何放置取决于设计需求和优缺点的权衡。<span class="em">1</span><span class="em">2</span><span class="em">3</span>
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