用C语言写缺陷无损检测系统的代码

缺陷无损检测系统是一种复杂的系统，需要使用多种技术和算法，因此代码的编写需要根据具体的应用场景和检测方法进行设计。以下是一个简单的例子，可以用于检测金属材料中的缺陷。

#include <stdio.h>
#include <stdlib.h>
#include <math.h>

#define PI 3.14159265358979323846

// 定义复数结构体
typedef struct {
    double real;
    double imag;
} Complex;

// 计算一维傅里叶变换
void fft(Complex *x, int n) {
    int i, j, k;
    Complex t, w;
    double p;
    int l = log(n) / log(2);

    for (i = 0; i < n; i++) {
        j = 0;
        for (k = 0; k < l; k++) {
            j <<= 1;
            j |= ((i >> k) & 1);
        }
        if (j < i) {
            t = x[i];
            x[i] = x[j];
            x[j] = t;
        }
    }

    for (i = 0; i < l; i++) {
        int m = 1 << i;
        int m2 = m << 1;
        w.real = 1;
        w.imag = 0;
        p = PI / m;
        Complex wp = { cos(p), -sin(p) };

        for (j = 0; j < m; j++) {
            for (k = j; k < n; k += m2) {
                t.real = w.real * x[k + m].real - w.imag * x[k + m].imag;
                t.imag = w.real * x[k + m].imag + w.imag * x[k + m].real;
                x[k + m].real = x[k].real - t.real;
                x[k + m].imag = x[k].imag - t.imag;
                x[k].real += t.real;
                x[k].imag += t.imag;
            }
            w.real = wp.real * w.real - wp.imag * w.imag;
            w.imag = wp.real * w.imag + wp.imag * w.real;
        }
    }
}

// 计算二维傅里叶变换
void fft2d(Complex **x, int nx, int ny) {
    int i, j;
    Complex *row = (Complex*)malloc(nx * sizeof(Complex));
    Complex *col = (Complex*)malloc(ny * sizeof(Complex));

    // 对每行进行傅里叶变换
    for (i = 0; i < ny; i++) {
        for (j = 0; j < nx; j++) {
            row[j] = x[j][i];
        }
        fft(row, nx);
        for (j = 0; j < nx; j++) {
            x[j][i] = row[j];
        }
    }

    // 对每列进行傅里叶变换
    for (i = 0; i < nx; i++) {
        for (j = 0; j < ny; j++) {
            col[j] = x[i][j];
        }
        fft(col, ny);
        for (j = 0; j < ny; j++) {
            x[i][j] = col[j];
        }
    }

    free(row);
    free(col);
}

// 检测缺陷
void detect_defect(Complex **x, int nx, int ny, double threshold) {
    int i, j;
    for (i = 0; i < nx; i++) {
        for (j = 0; j < ny; j++) {
            double mag = sqrt(x[i][j].real * x[i][j].real + x[i][j].imag * x[i][j].imag);
            if (mag > threshold) {
                printf("Defect detected at (%d, %d)\n", i, j);
            }
        }
    }
}

int main() {
    int nx = 64;
    int ny = 64;
    double threshold = 1000.0;
    Complex **x = (Complex**)malloc(nx * sizeof(Complex*));
    int i, j;
    for (i = 0; i < nx; i++) {
        x[i] = (Complex*)malloc(ny * sizeof(Complex));
        for (j = 0; j < ny; j++) {
            x[i][j].real = rand() % 256;
            x[i][j].imag = 0;
        }
    }

    fft2d(x, nx, ny);
    detect_defect(x, nx, ny, threshold);

    for (i = 0; i < nx; i++) {
        free(x[i]);
    }
    free(x);

    return 0;
}

该代码使用了一维和二维傅里叶变换来对输入数据进行频域分析，并在检测到缺陷时输出缺陷的位置坐标。需要注意的是，该代码只是一个简单的例子，实际应用中需要根据具体的需求进行修改和优化。