latch up闩锁效应

Latch-up (闩锁) refers to a type of electrical phenomenon that can occur in integrated circuits (ICs) where a low-impedance path is created between the power supply rails. This can cause the IC to draw excessive current, potentially leading to permanent damage.

The latch-up effect occurs when a parasitic thyristor-like structure within the IC becomes active, which can happen due to a variety of reasons such as overvoltage, overcurrent, or radiation-induced effects. Once triggered, the parasitic structure can latch onto a high-current state, effectively shorting the power supply rails and causing the IC to malfunction.

Designers of ICs take several measures to prevent latch-up, including careful layout, the use of guard rings, and the inclusion of built-in current limiting circuits. However, in certain situations, latch-up may still occur, and it can be a challenging problem to debug and fix.