Document Number: 001-98286 Rev. *H Page 15 of 106
8.2 Requirements for Reading Array Data
All memories require access time to output array data. In a read operation, data is read from one memory location at a time.
Addresses are presented to the device in random order, and the propagation delay through the device causes the data on its outputs
to arrive with the address on its inputs.
The device defaults to reading array data after device power-up or hardware reset. To read data from the memory array, the system
must first assert a valid address on Amax–A0, while driving OE# and CE# to V
IL
. WE# must remain at V
IH
. Data will appear on
DQ15–DQ0 after address access time (t
ACC
), which is equal to the delay from stable addresses to valid output data. The OE# signal
must be driven to V
IL
. Data is output on DQ15-DQ0 pins after the access time (t
OE
) has elapsed from the falling edge of OE#.
See Reading Array Data on page 30 for more information. Refer to Table 67 on page 84 and Table 68 on page 85 for timing
specifications and the timing diagram. Refer to Table 59 on page 77 and Table 60 on page 78 for the active current specification on
reading array data.
8.2.1 Page Mode Read
The device is capable of fast page mode read and is compatible with the page mode Mask ROM read operation. This mode provides
faster read access speed for random locations within a page. The page size of the device is 8 words / 16 bytes. The appropriate
page is selected by the higher address bits A(max)–A3. Address bits A2–A0 in word mode (A2–A-1 in byte mode) determine the
specific word within a page. This is an asynchronous operation; the microprocessor supplies the specific word location.
The random or initial page access is equal to t
ACC
or t
CE
and subsequent page read accesses (as long as the locations specified by
the microprocessor falls within that page) is equivalent to t
PACC
. When CE# is deasserted and reasserted for a subsequent access,
the access time is t
ACC
or t
CE
. Fast page mode accesses are obtained by keeping the read-page addresses constant and changing
the intra-read page addresses.
8.3 Writing Commands / Command Sequences
To write a command or command sequence (which includes programming data to the device and erasing sectors of memory), the
system must drive WE# and CE# to V
IL
, and OE# to V
IH
.
The device features an Unlock Bypass mode to facilitate faster programming. Once the device enters the Unlock Bypass mode,
only two write cycles are required to program a word, instead of four. The Table 18 on page 32 contains details on programming
data to the device using both standard and Unlock Bypass command sequences.
An erase operation can erase one sector, multiple sectors, or the entire device. Tables 6–9 indicate the address space that each
sector occupies.
Refer to DC Characteristicst on page 77 for the active current specification for the write mode. The AC Characteristics section
contains timing specification tables and timing diagrams for write operations.
8.3.1 Write Buffer
Write Buffer Programming allows the system write to a maximum of 128 words / 256 bytes in one programming operation. This
results in faster effective programming time than the standard programming algorithms.
8.3.2 Accelerated Program Operation
The device offers program operations through the ACC function. This is one of two functions provided by the WP#/ACC or ACC pin,
depending on model number. This function is primarily intended to support manufacturing programming operations at the factory.
If the system asserts V
HH
on this pin, the device automatically enters the Unlock Bypass mode, protected sectors will remain
protected. The system would use a two-cycle program command sequence as required by the Unlock Bypass mode. Removing V
HH
from the WP#/ACC or ACC pin, depending on model number, returns the device to normal operation. Note that the WP#/ACC or
ACC pin must be raised to V
HH
prior to any accelerated operation and should return to V
IL
/V
IH
after the completion of the
accelerated operation. It should not be at V
HH
for operations other than accelerated programming, or device damage may result.
WP# contains an internal pull-up; when unconnected, WP# is at V
IH
.