LMP91000
www.ti.com.cn
ZHCSAR9I –JANUARY 2011–REVISED DECEMBER 2014
Electrical Characteristics (continued)
Unless otherwise specified, T
A
= 25°C, V
S
=(VDD – AGND), V
S
= 3.3 V and AGND = DGND = 0 V, VREF = 2.5 V, Internal
Zero = 20% VREF.
(1)
PARAMETER TEST CONDITIONS MIN
(2)
TYP
(3)
MAX
(2)
UNIT
Transimpedance gain accuracy 5%
Linearity ±0.05%
7 programmable gain resistors 2.75
3.5
7
TIA_GAIN
14
Programmable TIA Gains kΩ
35
120
350
Maximum external gain resistor 350
Internal zero voltage 3 programmable percentages of VREF 20%
50%
67%
TIA_ZV 3 programmable percentages of VDD 20%
50%
67%
Internal zero voltage Accuracy ±0.04%
RL Programmable Load 4 programmable resistive loads 10
33
Ω
50
100
Load accuracy 5%
2.7 V ≤ VDD≤ 5.25 Internal zero 20% VREF
Power Supply Rejection Ratio at
V
PSRR Internal zero 50% VREF 80 110 dB
RE pin
Internal zero 67% VREF
TEMPERATURE SENSOR SPECIFICATION (Refer to Table 1 in the Feature Description for details)
Temperature Error TA= –40˚C to 85˚C –3 3 °C
Sensitivity TA= –40˚C to 85˚C -8.2 mV/°C
Power on time 1.9 ms
EXTERNAL REFERENCE SPECIFICATION
VREF External Voltage reference range 1.5 VDD V
Input impedance 10 MΩ
6.6 I
2
C Interface
Unless otherwise specified, T
A
= 25°C, V
S
= (VDD – AGND), 2.7 V <V
S
< 5.25 V and AGND = DGND = 0 V, VREF = 2.5 V.
(1)
PARAMETER TEST CONDITIONS MIN
(2)
TYP
(3)
MAX
(2)
UNIT
V
IH
Input High Voltage –40 to 80°C 0.7*VDD V
V
IL
Input Low Voltage –40 to 80°C 0.3*VDD V
V
OL
Output Low Voltage I
OUT
= 3 mA 0.4 V
Hysteresis
(4)
–40 to 80°C 0.1*VDD V
C
IN
Input Capacitance on all digital pins –40 to 80°C 0.5 pF
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using
statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(4) This parameter is specified by design or characterization.
Copyright © 2011–2014, Texas Instruments Incorporated 7
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