16
BQ79606A-Q1
ZHCSJM7 –APRIL 2019
www.ti.com.cn
Copyright © 2019, Texas Instruments Incorporated
Timing Requirements (continued)
V
BAT
= 5.5V to 30V, all LDOs operating in regulation, Typical Applications Circuit used, 3 to 6 cells connected, –40°C to
+105°C free-air temperature range (unless otherwise noted)
PARAMETERS TEST CONDITIONS MIN NOM MAX UNIT
n
WAKE
WAKE tone sending duration V
BAT
> 4.75V 40 pulses
n
SLPtoACTDET
SLEEPtoACTIVE tone receive threshold V
BAT
> 4.75V 20 pulses
n
SLPtoACT
SLEEPtoACTIVE tone sending duration V
BAT
> 4.75V 40 pulses
n
SHDNDET
SHUTDOWN tone receive threshold V
BAT
> 4.75V 100 pulses
n
SHDN
SHUTDOWN tone sending duration V
BAT
> 4.75V 185 pulses
n
FLTTONEDET
Fault tone detection threshold V
BAT
> 4.75V, fault condition present 20 pulses
n
FLTONE
Fault tone sending duration V
BAT
> 4.75V, fault condition present 40 pulses
t
FLTRETRY
Fault tone retry during persistent fault
condition
V
BAT
> 4.75V, fault condition present 50 ms
n
FLTHBDET
Heartbeat tone detection threshold
V
BAT
> 4.75V, no fault present, heartbeat
enabled
20 pulses
n
HBTONE
Heartbeat tone sending duration
V
BAT
> 4.75V, no fault present, heartbeat
enabled
40 pulses
t
WAITHB
Time between heartbeat tones
V
BAT
> 4.75V, no fault present, heartbeat
enabled
400 ms
t
HBTO
Heartbeat fault timeout
V
BAT
> 4.75V, fault signaled if no
heartbeat received with t
HBTO
1 s
t
HBFAST
Heartbeat received to fast threshold
V
BAT
> 4.75V, fault signaled if the time
between heartbeat tones is less than
t
HBFAST
200 ms
t
FLTTONE_HI
Fault pulse high time (analog delay
based)
1 µs
t
FLTTONE_LO
Fault pulse low time 1 µs
t
FLTTONE
Time between pulses within a fault tone
(LFO based). From the begning of a
pulse untill the begining of the next
pulse.
11.5 µs
t
COMTONE
Time between pulses within a comms
tone (HFO based). From the begning of a
pulse untill the begining of the next
pulse.
11 µs
t
TONE_HI
Comms pulse high time (HFO based) 1 µs
t
TONE_LO
Comms pulse low time (HFO based) 1 µs
t
FTS_Latency
Fault Tone Latency in stack device
Latency from fault tone received/detected
to fault tone going out in a stack device.
48 µs
t
FTB_Latency
Fault Tone Latency in base device
Latency from fault tone received/detected
in base device to NFAULT tone going
out.
24 µs
UART Interface
RXTX
BAUD
RX/TX signaling rate adjustable range V
BAT
> 4.75V 125 1000 kbps
ERR
BD(RX)
Input baud rate error V
BAT
> 4.75V –1.5% 1.5%
ERR
BD(TX)
Output baud rate error V
BAT
> 4.75V –1.5% 1.5%
t
UART(BRK)
Communications clear (break) time V
BAT
> 4.75V 15 20 bit periods
t
UART(StA)
SLEEPtoACTIVE time V
BAT
> 4.75V, RX held low 250 300 µs
t
UART(RST)
Communications reset time V
BAT
> 4.75V, RX held low 450 µs
t
UART(RXMIN)
Minimum RX high time after
Communications Clear received
1 bit periods
Safety Diagnostics
t
VIOUVDGL
Under-voltage deglitch on VIO
V
VIO
rising. V
VIO
< V
VIOUV
threshold to
corresponding flag set
25 µs
t
OVDGL
Over-voltage deglitch on supply rails
(AVDD, DVDD)
V
SUPPLY
rising. V
SUPPLY
> VOV threshold
to corresponding flag set
25 µs
t
OVCVDDDGL
Over-voltage deglitch on VLDO supply
rail
V
VLDO
rising. V
VLDO
> VOV threshold to
corresponding flag set
250 µs
t
UVDGL
Under-voltage deglitch on supply rails
(AVDD, CVDD)
V
SUPPLY
falling. V
SUPPLY
< VUV threshold
to corresponding flag set
25 µs