"IEEE Std 1450.3™-2007: ATE机台通用文件规则描述"

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The IEEE Std 1450.3™-2007 is a standardized document that provides guidelines for the Extensions to Standard Test Interface Language (STIL) for Tester Target Specification. This document, sponsored by the Test Technology Standards Committee of the IEEE Computer Society, aims to establish a set of rules and conventions for the development and implementation of Automated Test Equipment (ATE) systems. The document outlines the necessary specifications and requirements for ATE machine platforms, ensuring compatibility and interoperability among different test systems. It defines the structure, syntax, and semantics of STIL extensions for specifying test patterns, vectors, and timing information for ATE machine testing. Additionally, it provides guidelines for the use of custom test languages, interfaces, and extensions to accommodate the evolving needs of the semiconductor industry. One of the key features of the IEEE Std 1450.3™-2007 is its emphasis on modularity and flexibility in ATE system design. By providing a standardized framework for test program development, it allows for easy integration of new test modules and functionalities, promoting efficiency and scalability in ATE machine setups. This standardization also facilitates collaboration and knowledge sharing among different ATE vendors, promoting innovation and advancement in the field of semiconductor testing. Overall, the IEEE Std 1450.3™-2007 plays a crucial role in promoting the development and adoption of best practices in ATE machine design and testing. By providing a common platform for communication and collaboration, it helps ensure the reliability, accuracy, and efficiency of semiconductor testing processes, ultimately leading to higher quality products and improved performance in the electronics industry.

IEEE

Std 1450.3-2007 IEEE STANDARD FOR EXTENSIONS TO STIL

STIL.1: Refers to IEEE Std 1450.1. This extension to the STIL base standard is commonly referred to as

“dot 1”: Design information specification.

STIL.3: Refers to IEEE Std 1450.3 (i.e., this standard). This extension to the STIL base standard is

commonly referred to as “dot 3”: Tester target specification.

STIL.6: Refers to IEEE Std 1450.6. This extension to the STIL base standard is commonly referred to as

“dot 6”: Core test language specification.

TRC: (A) (Tester resource constraint) a set of STIL statements (i.e., this standard) that are used to specify

either 1) the resources available in a tester or 2) the resources needed in support of a STIL pattern.

(B) (Tester rule check) an operation performed by an application to verify the consistency between a pattern

and a set of tester resource constraints.

4. Structure of this standard

This document is an adjunct to IEEE Std 1450. The conventions established and defined in IEEE Std 1450

are used in this document and are included verbatim below.

Many clauses in this document add additional constructs to existing clauses in the IEEE Std 1450 document

and are so identified in the title. The constructs defined in this document are limited to the Environment

block as defined by IEEE Std 1450.1. All clauses in this document are normative unless specifically

identified as “Informative.” Example code is provided within each clause. More complete examples are

provided in the annexes, which are informative.

4.1 Formats from STIL.0

The following discussion is a copy of the conventions as defined in STIL.0 and followed by this document.

Different fonts are used as follows:

a) S

MALL CAP TEXT is used to indicate user data.

b) Courier text is used to indicate code examples.

In the syntax definitions:

a) S

MALL CAP TEXT is used to indicate user data.

b) Bold text is used to indicate keywords.

c) Italic text is used to reference metatypes.

d) () indicates optional syntax that may be used 0 or 1 time.

e) ()+ indicates syntax that may be used 1 or more time.

f) ()* indicates optional syntax that may be used 0 or more times.

g) <> indicates multiple choice arguments or syntax.

In the syntax explanations, the verb “shall” is used to indicate mandatory requirements. The meaning of a

mandatory requirement varies for different readers of the standard:

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IEEE

FOR TESTER TARGET SPECIFICATION Std 1450.3-2007

a) To developers of tools that process STIL (readers), “shall” denotes a requirement that the standard

imposes. The resulting implementation is required to enforce this requirement and to issue an error if

the requirement is not met by the input.

b) To developers of STIL file/stream (writers), “shall” denotes mandatory characteristics of the

language. The resulting output must conform to these characteristics.

c) To the users of STIL, “shall” denotes mandatory characteristics of the language. Users may depend

on these characteristics for interpretation of the STIL source.

The language definition clauses contain statements that use the phrase “it is an error” and “it may be

ambiguous.” These phrases indicate improperly defined STIL information. The interpretation of these

phrases will differ for the different readers of this standard in the same way that shall differs, as identified in

the list above.

4.2 Additional formatting conventions

The following items are new conventions that are used in the various paragraph types:

a) In the Syntax definitions, each statement or group of statements is identified by a syntax line number

(in paranthesis at the right side of the page). These numbers are to be referenced to the definitions

that follow, which contain the syntax line numbers in parenthesis on the left side of the page.

b) In the Syntax definitions, underlined attribute keywords indicate the default when none in a group is

selected.

c) In the code example sections of the document, the text is in Courier font and each line contains a

line number followed by a colon (:) at the left-hand side of the page. This line number is for

reference only and is not part of the code.

d) In the code examples, user-defined names (for things like signalnames, signal group names, block

names, etc.) are in all uppercase with under_score separators. This is to distinguish them from STIL

keywords.

e) In the tutorial examples (Annex D through Annex G), circled numbers on the right-hand side of the

code examples are used to indicate that a note about the code is included immediately after the

example.

4.3 Dependencies on IEEE Std 1450.1

This standard is built on IEEE Std 1450 and relies on some of the syntax as defined in the Design extension

(IEEE Std 1450.1). The following list provides the IEEE Std 1450.1 statements that are used by this

standard:

— Clause 5, Expressions constructs: The additional expression capabilities are used for defining

relationships between various TRC attributes (see Annex B).

— Clause 7, STIL statement: This statement, which is required at the beginning of every STIL file, is

extended to allow specification of the STIL extension standards.

— Clause 9, Variables block: This new block is required when fluid attributes are used (see Annex B).

— Clause 18: Environment block: The block allows for the definition of STIL information pertaining

to the environment of application in which a set of test pattern data is used. TRC is one such

environment, and hence, all TRC statements are contained within an Environment block.

— 18.2 “MAP_STRING” syntax and 18.3 NameMaps example: As part of the general Environment

block, syntax is defined that defines naming relationships to other environments. Tester channel

information makes use of this facility (see Annex C).

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IEEE

Std 1450.3-2007 IEEE STANDARD FOR EXTENSIONS TO STIL

6.1 TRC usage for ATE constraint specification

An ATE specification file is typically a separate file that specifies the attributes of one or more ATE systems.

It may contain a set of attributes that is the intersection of several ATE systems, thereby ensuring that a

pattern that meets the constraints will run on any ATE system. The file may define a class of ATE systems by

utilizing category variables or expressions. The structure of an ATE constraint file is as follows:

1: STIL 1.0 { Design 2005; TRC 2007; }

2: Header {

3: Source "IEEE Std 1450.3-2007";

4: Ann {* clause 6.1 *}

5: }

6: Environment {

Table 3—STIL/TRC block usage

Block/Statement/Function Purpose

Constraint

Constraint = Information that is used to convey constraints for an ATE system, or else a set of arbitrary instructions to be used to

constrain the implementation of a chip design or chip test patterns.

Report

Report = Information that is used to report the actual parameters of a given pattern or pattern burst.

Target

Tester Target = Information that is added to a STIL file/stream to specify how it is to be loaded into the resources of a given AT E

system.

Load

Tester Loading = Information that is used in a STIL file/stream to control the loading of the resources of an ATE system.

STIL file header id XXXX

Environment {} container block XX X

Environment {TRC { Usage Constraints; } } specify to use for constraints XX

Environment {TRC { Usage PatternReport; } } specify that data is a report X

Environment { TRC { Category {} } select one or more categories XX

Environment { TRC { SystemAttributes {} }} define system application XX

Environment { TRC { NameChecks {} }} define name constraints X

Environment { TRC { PatternAttributes {} }} define pattern information XX X

Environment { TRC { PeriodAttributes {} } define period information XX X

Environment { TRC { SignalAttributes {} }} define signal information XX X

Environment { TRC { WaveformAttributes {} } define waveform information XX X

Environment { TRC { WaveformDescriptions {} }} define wave shapes XX X

STIL blocks any block in STIL XX

Environment { NameMaps {} } map STIL names to other form XX

Pragma {} define ATE native statements XX

<<resource_id>> within STIL blocks define ATE resource mapping XX

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