非对称装置去除(AFР)设计准则与算法解析
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"AFR for asymmetric fixture.pdf" 文件主要探讨了自动夹具移除(AFR)技术在非对称夹具去嵌入(de-embedding)中的应用，涉及到S参数的切割工具和算法分析。
在高速电子设计中，信号完整性是至关重要的。随着单端或差分通道的数据速率不断提高，允许的抖动水平降低，准确地模拟和分析信号传输路径变得越来越重要。其中，夹具（fixture）在测试和测量中扮演着关键角色，它们用于稳定和固定被测设备，但其自身的电气特性可能会影响测量结果。因此，去除这些非理想影响的过程称为去嵌入。
AFR技术是一种自动化的解决方法，旨在消除非对称夹具对S参数测量的影响。非对称性可能源于夹具结构、尺寸或材料的不对称，这会导致测量数据失真，进而影响信号完整性分析的准确性。本研究提出了两种设计准则——被动性和不连续性，以评估和优化AFR过程中的夹具设计。
1. 被动性：在电子系统中，被动元件不会消耗能量，而只会改变信号的传播路径。在AFR中，夹具应尽可能保持被动，这意味着它不应引入额外的信号增益或损耗，以免对测量数据造成扭曲。
2. 不连续性：不连续性指的是信号路径中的突变，这可能会导致反射和信号质量下降。理想的夹具设计应该尽量减少信号路径中的不连续性，以确保信号的平滑传输。
为了验证上述设计准则，研究人员对三种不同的2x夹具进行了实验研究。通过对比分析，他们评估了这些准则在实际应用中的效果，从而为设计高精度的AFR算法提供了理论依据。
关键词：自动夹具移除(AFR)，设计准则，去嵌入
总结起来，该文件深入探讨了AFR技术在处理非对称夹具时的关键问题，提出了新的设计标准，并通过实例验证了这些标准的有效性。这对于提升高速电子系统的信号完整性和测量准确性具有重要意义，对于从事相关领域的工程师来说，是极具价值的参考资料。
Design Criteria of Automatic Fixture Removal (AFR)
for Asymmetric Fixture De-embedding
Changwook Yoon, Mikheil Tsiklauri, Mikhail
Zvonkin, Jun Fan, James L. Drewniak
EMC Laboratory
Missouri University of Science and Technology
Rolla, MO 65401, US
yooncha@mst.edu
Alexander Razmadze, Aman Aflaki
Altera Corporation
San Jose, CA 95134, USA
Jingook Kim
School of Electrical and Computer Engineering
Ulsan National Institute of Science and Technology
Ulsan, South Korea
Qinghua Bill Chen
Yangtze Delta Region Institute of Tsinghua University
Jiaxing, China
School of Software and Microelectronics, Peking
University
Beijing, China
Abstract— Automatic fixture removal (AFR) for asymmetric
fixture de-embedding is introduced. Two design criteria for
fixture design in AFR, passivity and discontinuity, are proposed.
Three different 2x-fixtures are investigated for the verification of
proposed two design criteria.
Keywords— automatic fixture removal (AFR), design criteria,
de-embedding
I. INTRODUCTION
As a data-rate on a single-ended or differential channel
increases and allowable jitter level decreases, an allowable
jitter level has been decreasing. Most of measured jitter comes
from the undesired fixture on PCB/package. Therefore, de-
embedding of undesired fixture has been becoming
increasingly important to know the pure jitter level at I/O
buffer. An accurate characterization along with undesired
fixture is an important work in modern multi-gigabit digital
channel.
In general, the fixture inevitably includes lots of unexpected
discontinuity elements such as ball-pad, via, cable and
connector. Thu, many previous researches regarding fixture
characterization have been reported. The equivalent lumped
model based on 3D geometry is widely and traditionally used
method.[1][2][3] However, 3D simulation takes long time and
results are different depending on solving algorithms.[4][5][6]
On the contrary, general calibration methods through network
analyzer is another ways to characterize the fixture.[7][8]
However, this approach has strong confidence only if all
parasitic at the termination is well known.
In order to characterize the asymmetric fixture with a high
accuracy, automatic fixture removal (AFR) using symmetric
2x-fixture consisting of the asymmetric 1x-fixtures has been
currently popular.[9][10][11][12][13] AFR basically is
suitable for reciprocal and passive fixture. Since 2x-fixture is
always symmetric and has same mount types at both ends, the
measured S-parameter can be easily obtained through a
conventional calibration standard. However, S-parameter for
the asymmetric fixture has no reference data to check its
accuracy. All previously reports only focus on applying AFR
algorithm to their fixtures and calculating S-parameter of 1x-
fixture without any verification procedure.
This paper introduces a basic AFR theory about how to
calculate S-parameter of asymmetry 1x-fixture. AFR method
basically needs the symmetry 2x-fixture and its time domain
reflectometric (TDR) waveform. However, the result of
asymmetry 1x-fixture is very sensitive to a difference in the
design of symmetry 2x-fixture. If a very small error occurs,
this small error eventually brings a large error after de-
embedding. Thus, this paper proposes two design criteria for
the design of 2x-fixture for AFR application and shows that
results are very different depending on design criteria. In order
to validate proposed two design criteria in AFR, three
asymmetric fixtures are designed under different conditions.
II. AUTOMATIC FIXTURE REMOVAL
Asymmetric 1x-fixture is characterized through a
relationship between S-parameters and time-domain
reflectometer (TDR) waveform.
A. 2x-Fixture Design
In order to apply AFR algorithm, 2x-fixture consisting of
1x-fixtures is necessary as shown in Fig. 1. If 1x-fixture is
passive and reciprocal, two insertion losses of 1x-fixture are
same [S
21
1x
= S
12
1x
] but return losses are different [S
11
1x
≠S
22
1x
]
respectively. Therefore, The right 1x-fixture has flipped
component at the diagonal line in S-parameter. After
cascading both 1x-fixtures, 2x-fixture naturally has a
symmetric structure and same insertion loss and return loss
along with diagonal line [S
11
2x
= S
22
2x
, S
21
2x
= S
12
2x
].
978-1-4799-5545-9/14/$31.00 ©2014 IEEE 654
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