TRI5000 测试原理

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C-1-1 Open / Short 測試原理....................................................................................3 C-1-1-1 為什麼使用短路群(Short Group)........................................................3 C-1-1-2 如何形成短路群..................................................................................4 C-1-1-3 如何決定Raw THD之值....................................................................5 C-1-1-4 短路測試原理......................................................................................5 C-1-1-5 OPI 與SPI測試...................................................................................7 C-1-2 JUMPER測試原理.........................................................................................8 C-1-2-1 模式0 (使用開路/短路(OPS)量測)....................................................8 C-1-2-2 模式1 (使用電阻量測)........................................................................8 C-1-2-3 模式2 (使用電阻量測)........................................................................9 C-1-3 電阻量測..........................................................................................................9 C-1-3-1電阻測試原理......................................................................................9 C-1-3-2 定電流源量測 MODE 0......................................................................9 C-1-3-3 低電流之定電流源量測MODE 1....................................................10 C-1-3-4 快速電阻測試MODE2.....................................................................10 C-1-4 電容量測........................................................................................................11 C-1-4-1電容測試原理....................................................................................11 C-1-4-2 AC Measure (MODE 0,1,2,3).............................................................13 C-1-4-3 CX // RX (MODE 5,6,7)....................................................................13 C-1-4-4 DC Constant Current test MODE4, MODE8.....................................14 C-1-5 電感量測........................................................................................................15 C-1-5-1電感量測原理....................................................................................15 C-1-5-2 AC Measure (MODE 0,1,2,3).............................................................16 C-1-5-3 Lx // Rx (MODE 5,6,7).............

TR-5000

系列

C-1

類比測試原理

(Ver.1.0) 1/26

TR-5000 Series

類比測試原理

Test Research, Inc.

April, 2004

Better Testing Better Quality ©Test Research, Inc.

TR-5000

系列

C-1

類比測試原理

(Ver.1.0) 2/26

C-1-1 Open / Short 測試原理.................................................................................... 3

C-1-1-1 為什麼使用短路群(Short Group)........................................................ 3

C-1-1-2 如何形成短路群.................................................................................. 4

C-1-1-3 如何決定 Raw THD 之值.................................................................... 5

C-1-1-4 短路測試原理...................................................................................... 5

C-1-1-5 OPI 與 SPI 測試................................................................................... 7

C-1-2 JUMPER 測試原理 ......................................................................................... 8

C-1-2-1 模式 0 (使用開路/短路(OPS)量測) .................................................... 8

C-1-2-2 模式 1 (使用電阻量測)........................................................................ 8

C-1-2-3 模式 2 (使用電阻量測)........................................................................ 9

C-1-3 電阻量測.......................................................................................................... 9

C-1-3-1 電阻測試原理 ...................................................................................... 9

C-1-3-2 定電流源量測 MODE 0 ...................................................................... 9

C-1-3-3 低電流之定電流源量測 MODE 1 .................................................... 10

C-1-3-4 快速電阻測試 MODE2 ..................................................................... 10

C-1-4 電容量測........................................................................................................ 11

C-1-4-1 電容測試原理 .................................................................................... 11

C-1-4-2 AC Measure (MODE 0,1,2,3)............................................................. 13

C-1-4-3 CX // RX (MODE 5,6,7) .................................................................... 13

C-1-4-4 DC Constant Current test MODE4, MODE8 ..................................... 14

C-1-5 電感量測........................................................................................................ 15

C-1-5-1 電感量測原理 .................................................................................... 15

C-1-5-2 AC Measure (MODE 0,1,2,3)............................................................. 16

C-1-5-3 Lx // Rx (MODE 5,6,7) ...................................................................... 17

C-1-6 電晶體量測 Measurement of Transistor ....................................................... 17

C-1-6-1 V

量測 Measurement of VCE (MODE3, 4) .................................... 18

C-1-6-2 h

量測(MODE12, 13) ....................................................................... 18

C-1-7 FET 量測(MODE14, 15) ............................................................................... 18

C-1-8 IC Clamping Diode 量測............................................................................... 18

C-1-8-1 Clamping Diode 測試原理................................................................. 18

C-1-9 Agilent 測試技術........................................................................................... 19

C-1-9-1 Agilent TestJet 測試原理.................................................................... 19

C-1-10 三端電容極性測試技術.............................................................................. 21

C-1-10-1 三端電容極性測試原理.................................................................. 21

C-1-10-2 三端電容極性測試程式說明.......................................................... 23

C-1-11 隔離效果原理的探討.................................................................................. 26

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