11
Test duration and test temperature
Wait at each temperature setp until the DUT has
reached the new temperature. (minimum of 30
minutes)
Test temperatures: Tmin = -20 °C, Tmax =
+70 °C as per section 4
Number of DUTs
Ten samples as per test flow under section 6.1
Test flow
Twice, initially after the parameter test and finally
before the parameter test as per flow diagram under
section 6.1
Requirement: The functional status shall be class A as per ISO 16750-1: 2006.
6.1.5 Low-temperature operation
Purpose: This test simulates the load on the component at low temperatures. It is meant to verify the
function of the component after a long parking time or driving time at extremely low temperatures.
This test also simulates the exposure of the DUT to low temperatures with electrical operation, e.g. the use
of the system/components at very low ambient temperature. Failure mode is electrical malfunction caused
by low temperature, e.g. the freezing of capacitors with liquid electrolyte
This test is based on the specifications of ISO 16750-4, Section 5.1.1.2
Operating mode of the DUT
Operating mode 3.2 as per ISO 16750-1, relevant to
DUT as mentioned in section 5
Test duration and test temperature
24 h at -20°C
Number of DUTs
Two samples
Test flow
Individual test
Requirement: The functional status shall be class A as per ISO 16750-1: 2006.
6.1.6 High temperature operation
This test is based on the specifications of ISO 16750-4, Section 5.1.2.2
Purpose: This test simulates the exposure of the system/component to high temperatures with electrical
operation, for example, use at very high ambient temperature. Failure mode is electrical malfunction caused
by high temperature (e.g. thermal degradation of components).
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