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IEEE Standard for Access and Control
of Instrumentation Embedded within a
Semiconductor Device
Sponsored by the
Test Technology Standards Committee
IEEE
3 Park Avenue
New York, NY 10016-5997
USA
IEEE Computer Society
IEEE Std 1687™-2014
Authorized licensed use limited to: Advanced Micro Devices. Downloaded on February 04,2020 at 12:54:20 UTC from IEEE Xplore. Restrictions apply.
Authorized licensed use limited to: Advanced Micro Devices. Downloaded on February 04,2020 at 12:54:20 UTC from IEEE Xplore. Restrictions apply.
IEEE Std 1687™-2014
IEEE Standard for Access and Control
of Instrumentation Embedded within a
Semiconductor Device
Sponsor
Test Technology Standards Committee
of the
IEEE Computer Society
Approved 3 November 2014
IEEE-SA Standards Board
Authorized licensed use limited to: Advanced Micro Devices. Downloaded on February 04,2020 at 12:54:20 UTC from IEEE Xplore. Restrictions apply.
Abstract: A methodology for accessing instrumentation embedded within a semiconductor
device, without defining the instruments or their features themselves, via the IEEE 1149.1™ test
access port (TAP) and/or other signals, is described in this standard. The elements of the
methodology include a hardware architecture for the on-chip network connecting the instruments
to the chip pins, a hardware description language to describe this network, and a software
language and protocol for communicating with the instruments via this network.
Keywords: access network, built-in self-test (BIST), boundary scan, debug, design for testability
(DFT), embedded instruments, IEEE 1149.1™, IEEE 1687™, Instrument Connectivity Language
(ICL), internal JTAG (IJTAG), Joint Test Action Group (JTAG), on-chip instrumentation,
Procedural Description Language (PDL), test, Tool Command Language (Tcl)
•
The Institute of Electrical and Electronics Engineers, Inc.
3 Park Avenue, New York, NY 10016-5997, USA
Copyright © 2014 by The Institute of Electrical and Electronics Engineers, Inc.
All rights reserved. Published 5 December 2014. Printed in the United States of America.
IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by The Institute of Electrical and Electronics
Engineers, Incorporated.
PDF: ISBN 978-0-7381-9416-5 STD20033
Print: ISBN 978-0-7381-9417-2 STDPD20033
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.
No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission
of the publisher.
Authorized licensed use limited to: Advanced Micro Devices. Downloaded on February 04,2020 at 12:54:20 UTC from IEEE Xplore. Restrictions apply.
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