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AEC-Q200 标准
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AEC-Q200 Rev C STRESS TEST QUALIFICATION FOR PASSIVE COMPONENTS
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AEC-Q200-REV C
June 17, 2005
STRESS TEST QUALIFICATION
FOR
PASSIVE COMPONENTS
Component Technical Committee
Automotive Electronics Council
AEC-Q200-REV C
June 17, 2005
Component Technical Committee
Automotive Electronics Council
Acknowledgement
Any Document involving a complex technology brings together experience and skills from many sources.
The Automotive Electronics Council would especially like to thank the suppliers that provided input for this
document and recognize the following co-authors:
Brian Jendro Siemens VDO (256) 464-2980 brian.jendro.ext@siemensVDO.com
Robert Hulka, Jr. Delphi (765) 451-1616 robert.s.hulka.jr@delphi.com
Bob Knoell Visteon (313) 755-0162 rknoell@visteon.com
Larry Pilcher Visteon (313) 755-2935 lpilcher@visteon.com
Ken Kirby, Jr. Visteon (313) 755-7935 kkirby10@visteon.com
Ron Haberl Visteon (313) 755-5678 rhaberl@visteon.com
Additional input and assistance were provided by:
Walter Huck Murata whuck@murata.de
Erich Goertler Siemens VDO +49 (941) 790-4371 erich.goertler@siemens.com
John Timms Motorola ACES (847) 862-0223 john.timms@motorola.com
Roy Ozark Motorola ACES (847) 862-0220 roy.ozark@motorola.com
Lisa Jones Tyco Electronics (650) 361-2256 lajones@tycoelectronics.com
NOTICE
AEC documents contain material that has been prepared, reviewed, and approved through the AEC
Technical Committee.
AEC documents are designed to serve the automotive electronics industry through eliminating
misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement
of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for
use by those other than AEC members, whether the standard is to be used either domestically or
internationally.
AEC documents are adopted without regard to whether or not their adoption may involve patents or articles,
materials, or processes. By such action AEC does not assume any liability to any patent owner, nor does it
assume any obligation whatever to parties adopting the AEC documents. The information included in AEC
documents represents a sound approach to product specification and application, principally from the
automotive electronics system manufacturer viewpoint. No claims to be in Conformance with this document
may be made unless all requirements stated in the document are met.
Inquiries, comments, and suggestions relative to the content of this AEC document should be addressed to
the AEC Technical Committee on the link http://www.aecouncil.com.
Published by the Automotive Electronics Council.
This document may be downloaded free of charge, however AEC retains the copyright on this material. By
downloading this file the individual agrees not to charge for or resell the resulting material.
Printed in the U.S.A.
All rights reserved
Copyright © 2005 by Delphi Electronics & Safety, Siemens VDO, and Visteon Corporation. This document
may be freely reprinted with this copyright notice. This document cannot be changed without approval by the
AEC Components Technical Committee.
AEC-Q200-REV C
June 17, 2005
Component Technical Committee
Automotive Electronics Council
Table of Contents
Section Page
1.0 Scope 1
1.1 Description 1
1.1.1 Definition of Stress – Test Qualification 1
1.1.2 Approval for Use in an Application 2
1.2 Reference Documents 2
2.0 General Requirements 2-5
3.0 Qualification and Requalification 5-7
4.0 Qualification Tests 7-10
Table 1 – Qualification Sample Size Requirements 11-12
Table 2 – Table of Methods Referenced Tantalum and Ceramic 13-14
Table 2A – ceramic/Tantalum Process Change Qualification guidelines for the Selected Test 15
Table 3 - Table of Methods Referenced Aluminum Electrolytic Capacitors 16-17
Table 3A – Electrolytic Capacitor Process Change Qualification Guidelines for the Selected Test 18
Table 4 – Table Methods Referenced Film Capacitors 19-20
Table 4A – Film Capacitor Process Change Qualification Guidelines for the Selection of Test 21
Table 5 – Table of Methods Referenced Magnetics (Inductors/Transformers) 22-23
Table 5A – Inductive Products Process Change Qualification Guidelines for the selection of Test 24
Table 6 – Table of Methods Referenced Networks (R-C/C/R) 25-26
Table 6A/7A – Networks and Resistors Process Change Qualification Guidelines for Selection of Test 27
Table 7- Table of Methods Reference Resistors 28-29
Table 8 – Table of Methods Referenced Thermistors 30-31
Table 8A – Thermistor Process Change Qualification Guideline for the Selection of Test 32
Table 9 – Table of Methods Referenced Trimmer Capacitors/Resistors 33-34
Table 9A – Trimmers Capacitors/Resistors Process Change Qualification Guidelines for the
Selection of Test 35
Table 10 Table of Methods Referenced Varistors 36-37
Table 10A – Varistors Process Change Qualification Guidelines for the Selection of Test 38
Table 11 – Table of Methods Referenced Quartz Crystals 39-40
Table 11A – Quartz Crystal Process change Qualification guidelines for the Selection of Test 41
Table 12 – Table of Methods Referenced Ceramic Resonators 42-43
Table 12A – Ceramic Resonator Process Change Qualification Guidelines for the Selection of Test 44
Table 13 – Table of Methods Referenced Ferrite EMI Suppressors/Filters 45-46
Table 13A – Ferrite EMI Suppressors/Filters Process Change Qualification /Guideline for the Selection
of Test 47
Table 14 – Table of Methods Referenced Polymeric Resettable Fuses 48-49
Table 14A – Polymeric Resettable Fuses Process Change Qualification /Guideline for the Selection of
Test 50
Glossary of Terms/Abbreviations 51
Appendix 1 – Definition of a Qualification Family 52-54
Appendix 2 – Certificate of Design, Construction and Qualification (CDCQ) 55
Appendix 3 – Qualification Test Plan Format - Example 56-57
Appendix 4 – Data Presentation Format and Content - Example 58
Production Part Approval – Parametric Verification Summary – Example 59
Revision History 60
Attachment 1 AEC – Q200-001 Flame Retardance
Attachment 2 AEC – Q200-002 Human Body Model Electrostatic Discharge Test
Attachment 3 AEC – Q200-003 Beam Load (Break Strength) Test
Attachment 4 AEC – Q200-004 Resettable Fuse Test
AEC-Q200-REV C
June 17, 2005
Component Technical Committee
Automotive Electronics Council
Page 1 of 111
STRESS TEST QUALIFICATION
FOR PASSIVE ELECTRICAL DEVICES
1.0 SCOPE
1.1 Description
This specification defines the minimum stress test driven qualification requirements and
references test conditions for qualification of passive electrical devices. This document does not
relieve the supplier of their responsibility to meet their own company's internal qualification
program. In this document, "user" is defined as all companies that adhere to this document. The
user is responsible to confirm and validate all qualification and assessment data that
substantiates conformance to this document.
1.1.1 Definition of Stress-Test Qualification
Stress-Test “Qualification” is defined as successful completion of test requirements outlined in
this document and any applicable supplements and compliance to any applicable user packaging
specification. The minimum temperature range required for each passive electrical component
type is listed below (maximum capability) as well as example applications typical of each grade
(application specific):
TEMPERATURE RANGE GRADE
MINIMUM MAXIMUM
PASSIVE COMPONENT TYPE
Maximum capability
TYPICAL/EXAMPLE
APPLICATION
0
-50°C +150°C
Flat chip ceramic resistors, X8R ceramic
capacitors
All automotive
1
-40°C +125°C
Capacitor Networks, Resistors, Inductors,
Transformers, Thermistors, Resonators,
Crystals and Varistors, all other ceramic
and tantalum capacitors
Most underhood
2
-40°C +105°C
Aluminum Electrolytic capacitors
Passenger
compartment hot spots
3
-40°C +85°C
Film capacitors, Ferrites, R/R-C Networks
and Trimmer capacitors
Most passenger
compartment
4
0°C +70°C
Non-automotive
Qualification of the noted device type to it's minimum temperature grade allows the supplier to
claim the part as "AEC qualified" to that grade and all lesser grades. Qualification to
temperatures less than the minimum specified above would allow the supplier to claim the part as
"AEC qualified" at the lower grade only.
1.1.2 Approval for Use in an Application
“Approval” is defined as user approval for use of part in the application. The user’s method of
approval is beyond the scope of this document.
AEC-Q200-REV C
June 17, 2005
Component Technical Committee
Automotive Electronics Council
1.2 Reference Documents
Current revision of the referenced documents will be in effect at the date of agreement to the
qualification plan. Subsequent qualification plans will automatically use updated revisions of these
referenced documents.
1.2.1 Military/EIA
1. EIA-469 Destructive Physical Analysis (DPA)
2. MIL-STD-202 Test Methods for Electronic and Electrical Parts
3. EIA-198 Ceramic Dielectric Capacitors Classes I,II,III,IV
4. EIA-535 Tantalum Capacitors
5. J-STD-002 Solderability Spec
6. JESD22 JEDEC Standard
7. MIL-PRF-27 Test Methods for Inductors/Transformers
1.2.2 Industrial
1. UL-STD-94 Test for Flammability of Plastic Materials
2. ISO-7637-1 Road Vehicle Electrical Disturbance
1.2.3 AEC
1. AEC-Q200-001 Flame Retardance Test
2. AEC-Q200-002 ESD (Human Body Model)
3. AEC-Q200-003 Beam Load (Break Strength) Test
4. AEC-Q200-004 Polymeric Resettable Fuse Test
5. AEC-Q200-005 Board Flex Test
6. AEC-Q200-006 Terminal Strength Test
7. AEC-Q200-007 Voltage Surge Test
2.0 GENERAL REQUIREMENTS
2.1 Objective
The objective of this document is to ensure the device to be qualified meet the qualification
requirements detailed in Tables 2 - 14.
2.2 Precedence of Requirements
In the event of conflict in the requirements of this specification and those of any other documents,
the following order of precedence applies:
1. The purchase order
2. The user’s individual device specification
3. This document
4. The reference documents in Section 1.2 of this document
5. The supplier's data sheet
For the device to be considered a qualified part, the purchase order and/or individual device
specification cannot waive or detract from the requirements of this document.
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