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Proposed IEEE Standard P1450 - Review Document
STIL Language Manual 0.23 Page 1 5/21/96
Standard Test Interface Language (STIL)
for Digital Test Vector Data
Language Manual
Revision 0.23 “ALPHA-TEST”
Last Revised May 15, 1996
Table 1: STIL sub group members
Name Phone email
Greg Maston 602-814-4596 maston@chdasic.sps.mot.com
Tony Taylor 510-623-4841 tony_taylor@credence.com
Dave Dowding 602-786-7582 ddowding@microchip.com
Brady Harvey 802-769-7278 brady_harvey@vnet.ibm.com
Brad Hinkle 602-554-2903 bhinkle@sedona.intel.com
Larry Moran 818-991-2900 moran@std.teradyne.com
Chris Nelson 602-554-2799 cnelson@sedona.intel.com
Don Organ 408-383-2518 organ@ltx-tr.com
Jim Ward 408-433-0500 ward@ltx-tr.com
Gregg Wilder 214-480-4380 gwilder@ti.com
Proposed IEEE Standard P1450 - Review Document
STIL Language Manual 0.23 Page 2 5/21/96
Table 2: Revision History
In this document, the following third-party trademarks are used:
• Courier is a registered trademark of Smith-Corona Corp.
• UNIX is a registered trademark of UNIX System Laboratories, Inc.
Date Rev Init Change
1/27/96 0.20 gm Pulled from all sources and created 0.20 as a Frame
book.
2/21/96 0.21 gm Update incorporating WG changes
4/10/96 0.21 gm Tony:*1.0 delete the word
optional
in ()+ description.
*PatternSet still in section 2 (changed to Pattern).
*3.1 figure refs incorrect in text, also removed refer-
ences to “,” as whitespace in text. *9.4 figure refs
incorrect in text, cleaned up figure 15. *17.0 (and
appendix J) changed
Orientation
to
Alignment
per email
discussions. *Table 10 state “v” needs terminated-by
comment like state “t”. *18.1 removed “plus” on
category_name and selector_name; handled by multiple
statements. *21.1 changed font type of user-def values
in explanation to be consistant. *23.1 added definition
of \l to list of flags here to be complete. *added com-
ment in Appendix B indicating STIL v 0.17 in this sec-
tion.
4/16/96 0.21 gm removed “of page_num” on Page; sections always wrong.
corrected funny reference in section 16.0 in Termination
def.
4/20/96 0.22 tt Recombined all sections of the Language reference into a
single file for ease of on-line usage.
Other changes agreed upon in the apr18,19 stil_wg mtg.
4/30/96 0.22 gm Added Dave Dowding to list.Removed GNU disclaimer.
Reworded prolog to reflect current PAR wording.Added 0.3
“what STIL is NOT”. Removed PatternData from the docu-
ment. Added Multiple Bit Cyclized Data statement to Pat-
tern section, Length keyword to SignalGroups.
Incorporates Larry’s Latest BNF and Brady’s New Scan-
structs. Did lots of red ink around the use of “shall”.
5/21/96 0.23 gm 6.0 Added Spec Timing tutorial example. 11.13 Added
event_labels, ‘@n’ defs,
time_expr
, 11.17 Elaborated on
event_label name space (with spec vars). 27.2 added
Tony’s “incremental data vector”, 27.8 added a version
of MatchLoop. Removed all uses of the word “must”.
Proposed IEEE Standard P1450 - Review Document
STIL Language Manual 0.23 Page 3 5/21/96
Prologue
The STIL language has initially been developed by an ad-hoc consortium of test equipment ven-
dors, CAE and CAD vendors, and IC manufacturers, to address the lack of a common solution for
transferring digital test data from the generation environment to the test equipment. The following
two sections are excerpts from the IEEE PAR documentation to provide an orientation on the
foundation of this language. The third section identifies some aspects of test that were eliminated
from consideration for this current standard.
0.1 Orientation / Goal of the STIL Standard
This project is to define a standard language that:
a) Facilitates the transfer of large volumes of digital test information from Computer-Aided Engi-
neering (CAE) environments to Automated Test Equipment (ATE) environments;
b) Specifies pattern, format, and timing information sufficient to define the application of test vec-
tors to a Device Under Test (DUT);
c) Supports the volume of bulk test information generated from structured test such as scan/Auto-
matic Test Pattern Generation (ATPG), integral test techniques such as Built-In Self Test (BIST),
and functional test specification, for Integrated Circuit designs and their Assemblies, in a format
optimized for application in Automated Test Equipment (ATE) environments.
0.2 Purpose of the STIL Standard
Existing CAE tools have unique and differing software output interfaces which are not portable
into the unique and proprietary IC ATE input interfaces. Third party support environments have
not kept pace with the test requirements of VLSIC device and test data generated from structured
test (such as ATPG) or integral test techniques such as BIST. Definition of a standard to support
representation of this data in an efficient optimal format is beneficial to three parties: the CAE
vendors who must create this data, the IC vendors who must support and manipulate this data, and
the ATE vendors who must accept this data.
With a common standard between CAE and IC ATE environments, the generation, movement,
and processing of this test data is greatly facilitated. This standard also allows for immediate
access to test equipment supporting this standard, which benefits both ATE vendors and IC ven-
dors reviewing this equipment.
This standard will finally serve as a catalyst for the development of a set of standard third party
interface tools to both test and design aspects of IC device generation.
0.3 Some of What the STIL Standard is NOT
In setting the scope for any standard, some issues are defined to not be pertinant to the initial
project. The following list is a partial set of issues that were dropped from the scope of this initial
project, with a note as to why the issue was dropped. Any future revision of the standard is open
to extensions in all of these areas.
• Levels: a key aspect of a digital test program is the ability to establish voltage (and
Proposed IEEE Standard P1450 - Review Document
STIL Language Manual 0.23 Page 4 5/21/96
current) parameters for signals under test. Level handling is not explicitly defined in
the current standard as this information is both compact (not presenting a transporta-
tion issue) and commonly established independently of digital test data, requiring dif-
ferent support mechanisms outside the current scope of this standard.
• Diagnostic/Fault-tracing information: the goal of this standard is to optimally present
data that needs to be moved onto ATE. While diagnostic data, fault identification data,
and macro/design element correspondence data can fall into this category (and is often
fairly large), this standard is also focused on Integrated Circuit and Assemblies test,
and most debug/failure analysis occurs separately from the ATE for these structures.
Note that return of failure information (for off-ATE analysis) is also not part of the
standard as currently defined.
• Datalogging mechanisms, formatting, and control are generally not defined as part of
this current standard.
• Parametric Tests are not defined as an integral part of this standard, except for optional
pattern labels that identify potential locations for IDDQ tests.
• Program flow: test sequencing and ordering are not defined as part of the current stan-
dard except as necessary to define collections of digital patterns meant to execute as a
unit.
• Binning constructs are not part of the current standard.
• Analog or Mixed-Signal Test: while this is an area of concern for all participants, at
this point transfer of analog test data does not contribute to the same transportation
issue seen with digital data.
• Algorithmic pattern constructs (such as sequences commonly used for memory test)
are not currently defined as part of the standard.
• Parallel test/ multi-site test constructs are not an integral part of the current environ-
ment.
• User input and user control/options are not part of the current standard.
• Characterization tools, such as shmoo plots, are not defined as part of the current stan-
dard.
Proposed IEEE Standard P1450 - Review Document
STIL Language Manual 0.23 Page 5 5/21/96
Table of Contents
Prologue ................................................................................................ 3
Orientation / Goal of the STIL Standard . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Purpose of the STIL Standard . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Some of What the STIL Standard is NOT . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Table of Contents ................................................................................ 5
Structure of this Document ................................................................ 9
1.0 Conventions Used in this Document . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
STIL Orientation and Capabilities Tutorial ..................................... 11
2.0 STIL Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.0 Hello Tester . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
STIL Grammatical Constructs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Complexity and Language Subsets . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
4.0 Basic 74LS245 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
5.0 Structured Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
6.0 STIL Timing Expressions/"Spec" Information . . . . . . . . . . . . . . . . . . . . . . . 29
7.0 Multiple Data Elements Per Test Cycle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Multiple Bit Restrictions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
8.0 Complex Timing and Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Timing Inheritance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
9.0 Pattern Re-Use . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Pattern Re-Use Via SignalGroups / PatternBurst . . . . . . . . . . . . . . . . . . . . 39
Direct Access Test / Pattern Reuse in STIL . . . . . . . . . . . . . . . . . . . . . . . . . 40
10.0 Event Data/"Non-cyclized" STIL Information . . . . . . . . . . . . . . . . . . . . . . . . 46
Pure Event Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Mixed Event and Pattern Data in STIL . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
Fully Cyclized Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Language Reference ............................................................................ 56
11.0 STIL Syntax Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Case Sensitivity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Whitespace . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Reserved Words . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Reserved Characters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Comments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
Token Length . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
Character Strings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
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