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首页Cadence 版图验证--ASSURA PHYSICAL VERIFICATION & EXTRACTION SOLUTION
Cadence 版图验证--ASSURA PHYSICAL VERIFICATION & EXTRACTION SOLUTION Cadence 版图验证--ASSURA PHYSICAL VERIFICATION & EXTRACTION SOLUTION
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CADENCE CONFIDENTIAL
Design Solutions 2001
Custom IC Solutions
ASSURA
(TM)
PHYSICAL VERIFICATION &
EXTRACTION SOLUTION

CADENCE CONFIDENTIAL
ASSURA OFFERS...
•
Reduced cost of ownership
–
One tool - one rule file (Interactive and Batch in 1 tool Assura)
•
Capacity and performance for leading edge IC designs
–
For both analog and digital design; patented hierarchical technology
that scales with Moore’s law
•
Fast verification cycle times and easy UI
–
Efficient hierarchical debugging environment with a short locator
•
Easy adoption from Diva and Dracula
•
Accurate RC extraction integrated within the verification flow
•
Powerful, practical tools for OPC and Silicon-level verification

CADENCE CONFIDENTIAL
ASSURA PHYSICAL VERIFICATION &
EXTRACTION SOLUTIONS
Assura Layout
Assura Layout
Verification Suite
Verification Suite
Assura DRC
Assura DRC
Assura RCX
Assura RCX
Assura MP Option
Assura MP Option
Assura LVS
Assura LVS
Subwavelength LEM &
Subwavelength LEM &
Verification Tools
Verification Tools
Assura OPC
Assura OPC
Feature Generator
Feature Generator
Virtuoso Silicon
Virtuoso Silicon
Imager
Imager
Assura Silicon vs.
Assura Silicon vs.
Layout Verifier
Layout Verifier
DFII Design Environment
Analog Design Environment
Integrated Solution for Highest Productivity

CADENCE CONFIDENTIAL
Bell Labs DRC, LVS, RCX
Bell Labs DRC, LVS, RCX
PHYSICAL VERIFICATION ROADMAP
Dracula
Dracula
®
®
verification
verification
Diva
Diva
®
®
verification
verification
Assura™ verification
Assura™ verification
One tool / One rule deck
for both batch and interactive PV
Vampire™ DRC, LVS
Vampire™ DRC, LVS
Assura 2.0
Numerical Technologies
Sub-wavelength LEM
Dracula and Diva
will continue to be
supported

CADENCE CONFIDENTIAL
ASSURA PHYSICAL VERIFICATION &
EXTRACTION SOLUTIONS
Assura Layout
Assura Layout
Verification Suite
Verification Suite
Assura DRC
Assura DRC
Assura RCX
Assura RCX
Assura MP Option
Assura MP Option
Assura LVS
Assura LVS
Subwavelength LEM &
Subwavelength LEM &
Verification Tools
Verification Tools
Assura OPC
Assura OPC
Feature Generator
Feature Generator
Virtuoso Silicon
Virtuoso Silicon
Imager
Imager
Assura Silicon vs.
Assura Silicon vs.
Layout Verifier
Layout Verifier
DFII Design Environment
Analog Design Environment
Integrated Solution for Highest Productivity
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