目录
使用 MTU(内存测试单元)的 AURIX™ 内存检测
AP32197
1 导言 ....................................................................................5
1.1 对读者说 ...............................................................................5
1.2 范围和目的 .............................................................................5
1.3 缩略词 .................................................................................5
1.4 参考文献................................................................................5
2 内存测试单元 (MTU) ......................................................................6
2.1 概况 ...................................................................................6
2.2 MBIST(存储器单元内部建自测）............................................................6
2.3 存储器控制框图..........................................................................7
2.4 直接 CPU 接口............................................................................8
2.5 存储器控制寄存器........................................................................8
2.6 寄存器映射..............................................................................9
3 内存错误.................................................................................10
3.1 概况 ...................................................................................10
3.2 内存错误分类............................................................................10
3.2.1 静态和动态错误........................................................................11
3.2.2 简单错误和连锁错误....................................................................11
3.2.3 单个单元错误和多个单元错误............................................................11
4 内存测试算法.............................................................................12
4.1 概览和术语.............................................................................12
4.2 测试算法的选择.........................................................................12
4.3 算法测试参数...........................................................................14
4.3.1 寻址方向.............................................................................14
4.3.1.1 快速的列寻址.......................................................................14
4.3.1.2 快速的行寻址.......................................................................15
4.3.2 寻址方式.............................................................................16
4.3.3 后台数据..............................................................................16
4.4 测试算法的有效性........................................................................17
5 执行和用途...............................................................................18
5.1.1 启动内存测试时序.....................................................................18
5.2 MTU 执行的算法..........................................................................20
5.2.1 非破坏的倒置测试......................................................................20
5.2.2 Checkerboard 测试.....................................................................22
5.2.3 March-U 测试..........................................................................24
6 附录：使能/停用存储控制器..............................................................26
6.1 使能存储控制器.........................................................................26
6.2 停用存储控制器.........................................................................27
应用笔记 4 V1.0, 2014-05
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