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Identification cards — Test
methods —
Part 6:
Proximity cards
Cartes d’identification — Méthodes d’essai —
Partie 6: Cartes de proximité
INTERNATIONAL
STANDARD
ISO/IEC
10373-6
Reference number
ISO/IEC 10373-6:2016(E)
Third edition
2016-07-15
©
ISO/IEC 2016
ii © ISO/IEC 2016 – All rights reserved
COPYRIGHT PROTECTED DOCUMENT
© ISO/IEC 2016, Published in Switzerland
the requester.
Ch. de Blandonnet 8 • CP 401
CH-1214 Vernier, Geneva, Switzerland
Tel. +41 22 749 01 11
Fax +41 22 749 09 47
www.iso.org
ISO/IEC 10373-6:2016(E)
ISO/IEC 10373-6:2016(E)
ISO/IEC 2016 – All rights reserved
iii
Contents Page
Foreword............................................................................................................................................................................................... v
1 Scope ....................................................................................................................................................................................... 1
2 Normative references ....................................................................................................................................................... 1
3 Terms, definitions, symbols and abbreviated terms ............................................................................................ 2
3.1 Terms and definitions ...................................................................................................................................................... 2
3.2 Symbols and abbreviated terms ................................................................................................................................... 3
4 Default items applicable to the test methods .......................................................................................................... 5
4.1 Test environment ............................................................................................................................................................... 5
4.2 Pre-conditioning ................................................................................................................................................................ 5
4.3 Default tolerance ................................................................................................................................................................ 5
4.4 Spurious inductance ......................................................................................................................................................... 6
4.5 Total measurement uncertainty .................................................................................................................................. 6
5 Apparatus and circuits for test of ISO/IEC 14443-1 and ISO/IEC 14443-2 parameters .......................... 6
5.1 Minimum requirements for measurement instruments ..................................................................................... 6
5.1.1 Oscilloscope ......................................................................................................................................................................... 6
5.2 Calibration coils .................................................................................................................................................................. 6
5.2.1 Size of the calibration coil card ..................................................................................................................................... 6
5.2.2 Thickness and material of the calibration coil card ............................................................................................. 7
5.2.3 Coil characteristics ............................................................................................................................................................ 7
5.3 Test PCD assembly ............................................................................................................................................................. 7
5.3.1 Test PCD antenna ............................................................................................................................................................... 8
5.3.2 Sense coils ............................................................................................................................................................................. 9
5.3.3 Assembly of Test PCD ....................................................................................................................................................... 9
5.4 Reference PICC ................................................................................................................................................................. 10
5.4.1 Dimensions of the Reference PICC ............................................................................................................................ 10
5.4.2 Reference PICC construction ...................................................................................................................................... 10
5.4.3 Reference PICC resonance frequency tuning ........................................................................................................ 12
5.5 EMD test setup .................................................................................................................................................................. 13
5.5.1 General description ........................................................................................................................................................ 13
5.5.2 Computation of power versus time .......................................................................................................................... 13
5.5.3 Noise floor precondition test ...................................................................................................................................... 14
6 Test of ISO/IEC 14443-1 parameters ....................................................................................................................... 14
6.1 PCD tests ............................................................................................................................................................................. 14
6.1.1 Alternating magnetic field ........................................................................................................................................... 14
6.2 PICC tests ............................................................................................................................................................................ 15
6.2.1 Alternating magnetic field ........................................................................................................................................... 15
6.2.2 Static electricity test ...................................................................................................................................................... 16
6.3 PXD tests ............................................................................................................................................................................. 17
7 Test of ISO/IEC 14443-2 parameters ....................................................................................................................... 18
7.1 PCD tests ............................................................................................................................................................................. 18
7.1.1 PCD field strength ........................................................................................................................................................... 18
7.1.2 Void ...................................................................................................................................................................................... 19
7.1.3 Void ...................................................................................................................................................................................... 19
7.1.4 Modulation index and waveform .............................................................................................................................. 19
7.1.5 Load modulation reception ......................................................................................................................................... 20
7.1.6 PCD EMD immunity test ................................................................................................................................................ 21
7.1.7 PCD EMD recovery test .................................................................................................................................................. 22
7.2 PICC tests ............................................................................................................................................................................ 23
ISO/IEC 10373-6:2016(E)
iv
ISO/IEC 2016 – All rights reserved
7.2.1 PICC transmission ........................................................................................................................................................... 23
7.2.2 PICC EMD level and low EMD time test ................................................................................................................... 25
7.2.3 PICC reception .................................................................................................................................................................. 26
7.2.4 PICC resonance frequency (informative) ............................................................................................................... 27
7.2.5 PICC maximum loading effect ..................................................................................................................................... 28
7.3 Test methods for bit rates of 3fc/4, fc, 3fc/2 and 2fc from PCD to PICC ...................................................... 29
7.4 PXD tests ............................................................................................................................................................................. 29
8 Test of ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters ............................................................................ 29
8.1 PCD tests ............................................................................................................................................................................. 29
8.2 PICC tests ............................................................................................................................................................................ 29
8.3 PXD tests ............................................................................................................................................................................. 29
8.3.1 PCD and PICC Modes ...................................................................................................................................................... 29
8.3.2 Automatic mode alternation ....................................................................................................................................... 29
Annex A (normative) Test PCD antennas .............................................................................................................................. 34
Annex B (informative) Test PCD Antenna tuning .............................................................................................................. 43
Annex C (normative) Sense coil ................................................................................................................................................ 45
Annex D (normative) Reference PICCs .................................................................................................................................. 48
Annex E (normative) Modulation index and waveform analysis tool ........................................................................ 56
Annex F (informative) Program for the evaluation of the spectrum ........................................................................ 111
Annex G (normative) Additional PICC test methods ....................................................................................................... 117
Annex H (normative) Additional PCD test methods ....................................................................................................... 179
Annex I (normative) High bit rate selection test methods for PCD ........................................................................... 218
Annex J (informative) Program for EMD level measurements ................................................................................... 232
Annex K (normative) Test methods for bit rates of 3fc/4, fc, 3fc/2 and 2fc from PCD to PICC ....................... 245
Annex L (normative) Frame with error correction test methods .............................................................................. 331
Bibliography ................................................................................................................................................................................... 340
ISO/IEC 10373-6:2016(E)
ISO/IEC 2016 – All rights reserved
v
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are
members of ISO or IEC participate in the development of International Standards through technical
committees established by the respective organization to deal with particular fields of technical activity.
ISO and IEC technical committees collaborate in fields of mutual interest. Other international
organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the
work. In the field of information technology, ISO and IEC have established a joint technical committee,
ISO/IEC JTC 1.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the
different types of document should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent
rights. Details of any patent rights identified during the development of the document will be in the
Introduction and/or on the ISO list of patent declarations received (see www.iso.org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation on the meaning of ISO specific terms and expressions related to conformity
assessment, as well as information about ISO's adherence to the WTO principles in the Technical
Barriers to Trade (TBT) see the following URL: Foreword - Supplementary information
The committee responsible for this document is ISO/IEC JTC 1, Information technology, Subcommittee
SC 17, Cards and personal identification.
This third edition cancels and replaces the second edition (ISO/IEC 10373-6:2011), which has been
technically revised.
It also incorporates the Amendments ISO/IEC 10373-6:2011/Amd 1:2012, ISO/IEC 10373-6:2011/Amd
2:2012, ISO/IEC 10373-6:2011/Amd 3:2012, ISO/IEC 10373-6:2011/Amd 4:2012, and the Technical
Corrigendum ISO/IEC 10373-6:2011/Cor 1:2013.
ISO/IEC 10373 consists of the following parts, under the general title Identification cards — Test
methods:
— Part 1: General characteristics
— Part 2: Cards with magnetic stripes
— Part 3: Integrated circuit cards with contacts and related interface devices
— Part 5: Optical memory cards
— Part 6: Proximity cards
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