Motivation
Motivation
Coverage Measures Needed
Coverage Measures Needed
Functional Memory Testing
Functional Memory Testing
A multitude of fault models and test schemes proposed.
A multitude of fault models and test schemes proposed.
Quality of fault coverage difficult to assess.
Quality of fault coverage difficult to assess.
To validate new test schemes for:
To validate new test schemes for:
Embedded memories and BIST designs.
Embedded memories and BIST designs.
Specialized memory architectures (e.g., multiport, FIFO).
Specialized memory architectures (e.g., multiport, FIFO).
To evaluate and rank existing test algorithms:
To evaluate and rank existing test algorithms:
Deterministic/regular tests.
Deterministic/regular tests.
Pseudo-random/irregular tests.
Pseudo-random/irregular tests.
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