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AEC-Q200 REV D中英文
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AEC-Q200 REV D
June 1,
2010
STRESS
TEST
QUAL
I
F
I
CAT
I
ON
FOR
PASSIVE
COMPONENTS
Automotive Electronics
Council
Component Technical C
o
mm
i
ttee
Automotive Electronics
Council
Component Technical
Committee
AEC-Q200 REV D
June 1, 2010
Acknowledgement
感谢
Any Document involving a complex technology brings together experience and skills from many sources. The
Automotive Electronics Council would especially like to thank the technical committee members that provided input for
this document and recognize the following co-authors:
任何涉及到复杂技术的文件都来自于各个方面的经验和技能,为此汽车电子委员会由衷承认并感谢以下对该版文件有重要
贡献的人
Sustaining Members
固定会员
Robert Hulka, Jr.
Bob Knoell
Ken Kirby Jr.
Ron Haberl
Hadi Mehrooz
Jason Larson
Tom Mitchell
Gary Fisher
Delphi
Visteon
Visteon
Visteon
Continental
Continental
Autoliv
JCI
(765)451-8079
(734)710-7687
(734)710-7689
(734)710-7691
(256)464-1481
(248)223-8165
(616)394-6356
robert.s.hulka.jr@delphi.com
rknoell@visteon.com
kkirby10@visteon.com
rhaberl@visteon.com
hadi.mehrooz@continental-corporation.com
thomas.mitchell@autoliv.com
gary.b.fisher@jci.com
Technical Members 技
术会员
Steve Malo
y
TDK
(770)487-1460
steve.maloy@tdktca.com
Pat
r
ick Ne
y
man T
y
co
pne
y
man@t
y
coelect
r
onics.com
A
ndy Maha
r
d Vishay (847)862-0223 andy.maha
r
d@vishay.com
Dave Richa
r
dson
Ted Krueger
Roger Roberts
Mary Carter-Berrios
Daniel Vanderstraeten
Nick Lycoudes
Jeff Jarvis
Lanney McHargue
Chris Reynolds
Vishay
Vishay
Vishay
Kemet
AMIS
Freescale
AMRDEC
Murata
AVX
(770)887-2021
+(886) 2-2914-2601
(650)361-2256
+32 (/55) .33.23.30
(480)413-3343
(256)842-0160
(770)319-5159
(843)444-2868
david.
r
icha
r
dson@vishay.com
ted.krueger@vishay.com
marycarterberrios@kemet.com
daniel.vanderstraeten@amis.com
nick.lycoudes@freescale.com
jeff.jarvis@amrdec.army.mil
lmchargue@murata.com
creynolds@avxus.com
Page 2 of 74
Automotive Electronics
Council
Component Technical
Committee
AEC-Q200 REV D
June 1, 2010
NOTICE
注意事项
AEC documents contain material that has been prepared, reviewed, and approved through the AEC
Technical Committee.
AEC文件中的材料都是经过了AEC技术委员会所准备、评估和批准的。
AEC documents are designed to serve the automotive electronics industry through eliminating
misunderstandings between manufacturers and purchasers, facilitating interchangeability and
improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay
the proper product for use by those other than AEC members, whether the standard is to be used
either domestically or internationally.
AEC文件是为了服务于汽车电子工业,无论其标准是用在国内还
是国际上,都可排除器件制造商和采购商之间各方面的不一致性,推动产品的提高和可交换性,还能帮
助采购商在最小的时间耽搁内选择和获得来自那些非AEC成员的合适的产品。
AEC documents are adopted without regard to whether or not their adoption may involve patents or
articles, materials, or processes. By such action AEC does not assume any liability to any patent
owner, nor does it assume any obligation whatever to parties adopting the AEC documents. The
information included in AEC documents represents a sound approach to product specification and
application, principally from the automotive electronics system manufacturer viewpoint. No claims to
be in conformance with this document shall be made unless all requirements stated in the document
are met.
AEC文件并不关注其采纳的内容是否涉及到专利、文章、材料或工艺。AEC没有认为对专利拥
有者承担责任,也没有认为要对任何采用AEC文件者承担义务。汽车电子系统制造商的观点主要是AEC
文件里的信息能为产品的说明和应用提供一种很完美的方法。如果没有在本文件见到所陈述的要求,就
不能声称与本文件具有一致性。
Inquiries, comments, and suggestions relative to the content of this AEC document should be
addressed to the AEC Technical Committee on the link http://www.aecouncil.com
. 与AEC文件相关内
容的疑问、评论和建议请登陆链接AEC技术委员会网站: http://www.aecouncil.com
Published by the Automotive Electronics Council. 本文件由汽车电子委员会出版。
This document may be downloaded free of charge, however AEC retains the copyright on this
material. By downloading this file, the individual agrees not to charge for or resell the resulting
material. 尽管AEC拥有版权,但本文件可以免费下载。由于该下载方式,个人须同意不会对该文件索
价和转售。
Printed in the U.S.A. 美国印刷
All rights reserved 版权所有
Copyright © 2010 by the Automotive Electronics Council. This document may be freely reprinted with
this copyright notice. This document cannot be changed without approval from the AEC Component
Technical Committee.
汽车电子委员会享有著作权。本文件可以根据著作权注意事项进行再次出版印
刷。不经过AEC元器件技术委员会批准,本文件禁止任何更改。
Page 3 of 74
Automotive Electronics
Council
Component Technical
Committee
AEC-Q200 REV D
June 1, 2010
Table of Contents 目录
Section章节 Title 内容 Page(s)页码
1.0
Scope 范围
6
1.1 Description 描述 6
1.2
Re
f
e
r
ence Documents参考文件 7
2.0
Gene
r
al Requi
r
ements通用要求 8-10
3.0
Quali
f
ication and Requali
f
ication认证和重新认证 11-12
4.0
Quali
f
ication Tests认证测试 12-13
Table 1 - Quali
f
ication Sample Size Requi
r
ements表1-认证测试样品数量要求 14-15
Table 2 - Table of Methods Re
f
e
r
enced Tantalum and Ce
r
amic Capacito
r
s表2-钽和陶瓷电容器参考方法 16-17
Table 2A - Ceramic/Tantalum Process Change Qualification guidelines for the Selected Test 18
表格2A-陶瓷/钽制程改变认证测试项目选择指南
Table 2B -
A
cceptance C
r
ite
r
ia
f
or Ce
r
amic COG SMD Capacito
r
s表2B-陶瓷COG表面贴装电容器可接受标 19
Table 2C - Acceptance Criteria for Ceramic X7R and X5R SMD Capacitors表2C-陶瓷X7R和X5R表面贴装电容器可接受标准 20
Table 2D - Acceptance Criteria for Ceramic Tantalum and Niobium Oxide Capacitors表2D-钽和氧化铌电容器可接受标准 21
Table 3 - Table of Methods Re
f
e
r
enced
A
luminum Elect
r
ol
y
tic Capacito
r
s表3-铝电解电容器参考方法 22-23
Table 3A - Elect
r
ol
y
tic Capacitor P
r
ocess Change Quali
f
ication Guidelines
f
or the Selected Test 24
表格3A-电解电容器制程改变认证测试项目选择指南
Table 4 - Table Methods Re
f
e
r
enced Film Capacito
r
s 表4-薄膜电容器参考方法 25-26
Table 4A - Film Capacitor P
r
ocess Change Quali
f
ication Guidelines
f
or the Selection of Test 27
表格4A-薄膜电容器制程改变认证测试项目选择指南
Table 5 - Table of Methods Referenced Magnetics (Inductors/Transformers) 表5-电磁器件(电感/变压器)参考方法 28-29
Table 5A - Inductive P
r
oducts P
r
ocess Change Quali
f
ication Guidelines
f
or the selection of Test 30
表格5
A
-感应器件制程改变认证测试项目选择指南
Table 6 - Table of Methods Re
f
e
r
enced Net
w
o
r
ks (R-C/C/R) 表6-网络(R-C/C/R)参考方法 31-32
Table 6
A
/7
A
- Net
w
o
r
ks and Resisto
r
sP
r
ocess Change Quali
f
ication Guidelines
f
or Selection of Test 33
表格6
A
/7A-网络和电阻器制程改变认证测试项目选择指南
Table 7 - Table of Methods Re
f
e
r
ence Resisto
r
s表7-电阻器参考方法 34-35
Table 7B - Acceptance Criteria for Carbon Film Leaded Fixed Resistors表格7B-碳膜引脚固定电阻器的接受标准 36
Table 7C - Acceptance Criteria for Metal Film Leaded Fixed Resistors表格7C-金属膜引脚固定电阻器的接受标准 37
Table 7D - Acceptance Criteria for Metal Oxide Leaded Fixed Resistors表格7D-金属氧化物引脚固定电阻器的接受标准 38
Table 7E - Acceptance Criteria for Wire Wound Leaded Fixed Resistors表格7E-铜线绕线引脚固定电阻器的接受标准 39
Table 7F -
A
cceptance C
r
ite
r
ia
f
or SMD Chip Resisto
r
s 表格7F-表面贴装芯片阻器的接受标准 40
Table 8 - Table of Methods Re
f
e
r
enced The
r
misto
r
s表8-热敏电阻器参考方法 41-42
Table 8A - Thermistor Process Change Qualification Guideline for the Selection of Test 43
表格8A-热敏电阻器制程改变认证测试项目选择指南
Table 9 - Table of Methods Re
f
e
r
enced T
r
immer Capacitors
/
Resisto
r
s表9-可调电容器/电阻器参考方法 44-45
Table 9A - T
r
imme
r
s Capacitors/Resisto
r
sP
r
ocess Change Quali
f
ication Guidelines
f
or the 46
Selection of Test表格9
A
-可调电容器
/
电阻器制程改变认证测试项目选择指南
Table 10 - Table of Methods Re
f
e
r
enced Va
r
isto
r
s表10-变阻器参考方法 47-48
Table 10A - Varistors Process Change Qualification Guidelines for the Selection of Test 49
表格10A-变阻器制程改变认证测试项目选择指南
Table 11 - Table of Methods Re
f
e
r
enced Qua
r
tz C
r
y
stals表11-石英晶体参考方法 50-51
Table 11
A
- Qua
r
tz C
r
y
stal P
r
ocess change Quali
f
ication guidelines
f
or the Selection of Test 52
表格11
A
-石英晶体制程改变认证测试项目选择指南
Table 11B -
A
cceptance C
r
ite
r
ia
f
or Qua
r
tz C
r
y
stals表11B-石英晶体的可接受标准 53
Table 12 - Table of Methods Re
f
e
r
enced Ce
r
amic Resonato
r
s表12-陶瓷共鸣器参考方法 54-55
Table 12
A
- Ce
r
amic Resonato
r
P
r
ocess Change Quali
f
ication Guidelines
f
or the Selection of Test 56
表格12
A
-陶瓷共鸣器制程改变认证测试项目选择指南
Table 12B -
A
cceptance C
r
ite
r
ia
f
or Ce
r
amic Resonato
r
s表12B-陶瓷共鸣器的可接受标准 57
Table 13 - Table of Methods Re
f
e
r
enced Ferrite EMI Supp
r
essors
/
Filte
r
s 58-59
表13-铁氧体EMI干扰抑制器/过滤器参考方法
Table 13
A
- Ferrite EMI Suppressors/Filters Process Change Qualification /Guideline for t
he
Selec
t
ion
of Test 60
表格13
A
-铁氧体EMI干扰抑制器/过滤器制程改变认证测试项目选择指南
Table 14 - Table of Methods Referenced Polymeric Resettable Fuses表14-聚合自恢复保险丝参考方法 61-62
Table 14
A
- Polymeric Resettable Fuses Process Change Qualification /Guideline for the Selection of Test 63
表14
A
-聚合自恢复保险丝制程改变认证测试项目选择指南
Page 4 of 74
Automotive Electronics
Council
Component Technical
Committee
AEC-Q200 REV D
June 1, 2010
Table of Contents - Continued目录(续)
Section章节 Title 内容 Page(s)页码
Appendix 1 - Definition of a Qualification Family附录1 认证家族的定义 64-66
Appendix 2 - Certificate of Design, Construction and Qualification (CDCQ) 67
附录2-设计、建造和认证的证书(CDCQ)
Appendix 3 - Qualification Test Plan Format – Example
附录3-认证测试计划格式 68-69
Appendix 4 - Data Presentation Format and Content - Example
附录4-数据提交格式和内容 70
Production Part Approval – Parametric Verification Summary – Example 71
Revision History
生产部件批准-参数验证摘要-例子-修订记录 71-74
Attachment 1 - AEC – Q200-001 - Flame Retardance 附录1-AEC-Q200-001-阻燃性能测试 -
Attachment 2 - AEC – Q200-002 - Human Body Model Electrostatic Discharge Test -
附录2-AEC-Q200-002人体模式静电放电测试
Attachment 3 - AEC – Q200-003 - Beam Load (Break Strength) Test -
附录3-AEC-Q200-003射束负载(断裂强度)测试
Attachment 4 - AEC – Q200-004 - Resettable Fuse Test 附录4-AEC-Q200-004聚合自恢复保险丝测试 -
Attachment 5 - AEC – Q200-005 - Board Flex / Terminal Bond Strength Test -
附录5-AEC-Q200-005板弯曲/端子粘接强度测试
Attachment 6 - AEC – Q200-006 - Terminal Strength Surface Mount / Shear Stress Test -
附录6-AEC-Q200-006 端子强度(表面贴装元件)/切应力测试
Attachment 7 - AEC – Q200-007 - Voltage Surge Test 附录7-AEC-Q200-007电压浪涌测试 -
AEC-Q005 Pb-Free Requirements AEC-Q005无铅测试要求 -
Page 5 of 74
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