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Product Documentation
CONFIGURATION
SYS : PAS5500 series, TWINSCAN series
HW : 6 Inch reticles for 4x and 5x demagnification
SW : n.a.
Order Code
50163
Issue date
18 Jun 2007
Status
Final
Issue
2.1
ASML Confidential
This document is provided for employees of ASML and for selected employees of ASML's customers and agents,
in order to assist them in efficient use of ASML products. The document must not be disclosed to third parties.
RETICLE DESIGN MANUAL
6 Inch reticles
ASML Confidential
Copyright © 2007, ASML Holding N.V. (including affiliates). All rights reserved.
Disclaimer This publication is subject to change without notice and contains confidential and proprietary information of
ASML Holding N.V. or its affiliates ("ASML").
This documentation is for the intended purpose only and for the use of the intended recipient only. Please
retain control of this documentation. It is not to be forwarded or distributed. Any unauthorized review,
copying, use, disclosure or distribution is strictly prohibited. The material herein is provided "AS-IS" and
ASML makes no warranty of any kind with regard to this material.
ASML shall not be liable for errors and omissions contained herein.
Trademarks ASML, ASM Lithography, TWINSCAN, PAS 5500, PAS 5000, SA 5200, ATHENA, QUASAR, IRIS, ILIAS,
FOCAL, CPL, DDL, Micralign, Micrascan, 3DAlign, 2DStitching, 3DMetrology, MaskTools, LithoServer,
LithoGuide, Scattering Bars, MaskWeaver, LithoCruiser, LithoCool, AGILE, ImageTuner, EFESE and the
ASML logo are trademarks of ASML Holding N.V. or affiliate companies.
The trademarks may be used either alone or in combination with a further product designation.
Starlith, AERIAL, AERIAL II and, AERIAL XP are trademarks of Carl Zeiss.
Nothing in this publication is intended to make representations with regard to whether any trademark is
registered or to suggest that any sign other than those mentioned should not be considered to be a
trademark of ASML or of any third party.
Translation of
Documents
If this document is in a language other than English, please read the following text carefully.
While we strive to ensure that the information is translated correctly, no warranty or guarantee, express or
implied, is given as to its accuracy or that it is as current as the English version. We accept no liability for
any errors or omissions.
We shall not be liable for any damages (including, without limitation, damages for loss of business or loss of
profits) arising in contract, tort or otherwise from the use of or inability to use this document, or any material
contained in it, or from any action or decision taken as a result of using such material. If there is any conflict
or difference between the translated version of this document and its English version, the English version is
leading. If any part of the translated version is unclear, reference should be made to the English version.
Feedback If you have any comments, questions or ideas regarding this book or its contents, please contact us at:
e-mail comments@asml.com
post ASML
Publications Comments
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The Netherlands
fax +31 40 268 3883
Please include:
- The issue date
- The ordering code number
- The page number, chapter or part number
- Your comment
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- A proposal of any improvements.
Thank you for your support.
ASML Confidential
TABLE OF CONTENTS
Preface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . iii
PART I RETICLES FOR 4X REDUCTION
Chapter 1 Definitions of terms and concepts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
The definition of a location on a reticle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Reticle Layout and Orientation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
The definition of chromium border . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Name conventions for TIS marks. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Chapter 2 Generic Information on Reticle Design. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Reticle substrate Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
The birefringence of the substrate 12
Phase Shift Mask (PSM) reticles 13
Reticle compatibility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Contamination and Defects . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Bar code 15
Reticle prealignment mark 15
Reticle alignment mark 15
Reticle Data files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Reticle Database Format information 17
Typical usage 17
Data files on Wafer Alignment Marks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Chapter 3 Reticles Patterns (4x reduction) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
Reticle Prealignment mark . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Reticle alignment mark for PAS 5500 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
TIS marks for Reticle Blue Alignment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
The chromium borders for TIS_RBA marks 26
TIS_RBA-mark dimensions 27
Required chromium border between image field and TIS mark 28
TIS marks placement on production reticles 28
TIS marks for Reticle Shape Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
The layout of TIS_RSC marks 29
Chromium borders for vertical TIS_RSC marks 30
Chromium border between image field and vertical TIS_RSC marks 31
Vertical TIS_RSC marks placement on production reticles 31
How to deal with third-party reticle patterns . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Image Border . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Minimum window size (PAS 5500 and TWINSCAN) 38
Bar code . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
The 24-character bar code option 39
The 2D-Barcode option 41
Human Readable code . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
Release pin (R-pin) area . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
ASML Confidential
ii Table of Contents
Pellicle Design . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
General requirements for pellicles 48
Pellicle location lines 49
Chapter 4 Reticle Layout (4x reduction). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
PAS 5500/3x0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52
PAS 5500/3x0 reticle pattern location 52
Reticle and pellicle dimensions for PAS 5500/3x0 54
PAS 5500 Step & Scan family . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
PAS 5500 reticle pattern location 57
Reticle and pellicle dimensions for PAS 5500 Step & Scan 58
TWINSCAN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
TWINSCAN reticle pattern location 61
Reticle and pellicle dimensions for TWINSCAN 62
TWINSCAN Reticle Shape Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
Chromium-border and pellicle-frame specifications 65
RBA and TTL Compatible reticle for Step & Scan systems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .68
PAS 5500 Step & Scan models, and TWINSCAN reticle pattern location 68
Reticle and pellicle dimensions for RBA and TTL compatible reticles 70
PART II RETICLES FOR 5X REDUCTION
Chapter 5 Definition of terms and concepts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
Reticle layout and orientation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
Chapter 6 Generic Information on Reticle Design . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
Reticle substrate specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
Contamination and Defects. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
Bar Code 78
Reticle prealignment mark 78
Reticle alignment mark 79
Reticle Data files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
Chapter 7 Reticle Patterns (5x reduction) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
Reticle prealignment mark . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83
Reticle alignment mark . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84
Bar Code . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
The 24-character bar code option 87
Pellicle position lines. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89
Human readable code . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89
Image border . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89
Minimum window 91
General requirements for Pellicles. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
Chapter 8 Reticle Layout (5x reduction). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
PAS 5500/22 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
PAS 5500/60 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
PAS 5500/80 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102
PAS 5500/90 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106
PAS 5500/1xx series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110
PAS 5500/2xx series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 114
ASML Confidential
PREFACE
This manual gives a description of the layout requirements for reticles used in the
6-inch reticle versions of:
• The PAS 5500 wafer steppers
• The PAS 5500 Step & Scan models
• The TWINSCAN models.
Also described in this manual are:
• The areas which can be used for identification of the reticle.
• The pellicle specifications for the various reticles.
• The defect specifications for the various reticle patterns.
• The release pin areas.
A Calma GDS2 description, in STREAM format, of all the reticle layers of different
systems, the TIS mark set and typical alignment marks is available on ASML
CustomerNet.
For additional help with reticle patterns, please contact your local ASML sales office.
Note
Please note that with the introduction of this manual the reticle design
specifications of previous releases of the Reticle Design Manual are not valid
anymore.
Note
Any deviation from the positions or dimensions described may cause
damage to, or malfunctioning of the system.
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