三星（4412手册完整版）SEC_Exynos 4412 SCP_Users Manual_Ver.0.10.00_Prelim...

Exynos 4412 SCP

RISC Microprocessor

Revision 0.10

April 2012

 2012 Samsung Electronics Co., Ltd. All rights reserved.

right to make changes to the information in this publication

at any time without prior notice. All information provided is

for reference purpose only. Samsung assumes no

responsibility for possible errors or omissions, or for any

consequences resulting from the use of the information

contained herein.

This publication on its own does not convey any license,

either express or implied, relating to any Samsung and/or

third-party products, under the intellectual property rights of

Samsung and/or any third parties.

specifically disclaims any and all liability, including without

applications. "Typical" parameters can and do vary in

different applications. All operating parameters, including

"Typicals" must be validated for each customer application

by the customer's technical experts.

Samsung products are not designed, intended, or authorized

for use in applications intended to support or sustain life, or

for any other application in which the failure of the Samsung

product could reasonably be expected to create a situation

where personal injury or death may occur. Customers

acknowledge and agree that they are solely responsible to

indemnify and hold Samsung and its officers, employees,

subsidiaries, affiliates, and distributors harmless against all

claims, costs, damages, expenses, and reasonable attorney

fees arising out of, either directly or indirectly, any claim

(including but not limited to personal injury or death) that

may be associated with such unintended, unauthorized

stored in a retrieval system, or transmitted in any form or by

any means, electric or mechanical, by photocopying,

recipients only. This publication contains confidential

information (including trade secrets) of Samsung protected

by Competition Law, Trade Secrets Protection Act and other

related laws, and therefore may not be, in part or in whole,

directly or indirectly publicized, distributed, photocopied or

used (including in a posting on the Internet where

unspecified access is possible) by any unauthorized third

party. Samsung reserves its right to take any and all

measures both in equity and law available to it and claim full

采取法律措施，包括但不限于提出损害赔偿请求。

Samsung Electronics Co., Ltd.

San #24 Nongseo-Dong, Giheung-Gu

Yongin-City, Gyeonggi-Do, Korea 446-711

Contact Us: mobilesol.cs@samsung.com

Home Page: http://www.samsungsemi.com

 MMC and eMMC are trademarks of MultiMediaCard Association.

 JTAG is a registered trademark of JTAG Technologies, Inc.

 Synopsys is a registered trademark of Synopsys, Inc.

 I2S is a trademark of Phillips Electronics.

 I2C is a trademark of Phillips Semiconductor Corp.

 MIPI and Slimbus are registered trademarks of the Mobile Industry Processor Interface (MIPI) Alliance.

All other trademarks used in this publication are the property of their respective owners.

Precaution against Electrostatic Discharge

Contamination

Be sure to use semiconductor products in the environment that may not be exposed to dust or dirt adhesion.

Temperature/Humidity

Semiconductor devices are sensitive to environment temperature and humidity. High temperature or humidity may

deteriorate semiconductor device‟s characteristics. Therefore avoid storage or use in such conditions.

Mechanical Shock

Care should be exercised not to apply excessive mechanical shock or force on semiconductor device.

In case of non-EMC (Epoxy Molding Compound) package, do not expose semiconductor IC to strong light. It may

cause device‟s malfunction. (But, some special products which utilize the light or have security function are

excepted from this guide)

Radioactive, Cosmic and X-ray

Semiconductor devices can be influenced by radioactive, cosmic ray or X-ray. Radioactive, cosmic and X-ray may

cause soft error during device operation. Therefore semiconductor devices must be shielded under environment

EMS (Electromagnetic Susceptibility)