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首页STDF_Version_4_Specification.pdf
STDF_Version_4_Specification.pdf
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更新于2023-05-26
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本文件描述了STDF文件的模块化划分,文件的字段分析,字段的处理方法,测试数据记录模块,数据类型,数据的读取方式,已经各种数据的功能意义
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STDF Specification V4 Page i
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Standard Test Data Format
(STDF)
Specification
Version 4
Table of Contents
Click on any entry.
Introduction to STDF
Teradyne’s Use of the STDF Specification
STDF Design Objectives
STDF Record Structure
STDF Record Header
Record Types and Subtypes
Data Type Codes and Representation
Note on Time and Date Usage
Optional Fields and Missing/Invalid Data
STDF Record Types
Note on “Initial Sequence”
Alphabetical Listing
File Attributes Record (FAR) 16
Audit Trail Record (ATR) 17
Master Information Record (MIR) 18
Master Results Record (MRR) 21
Part Count Record (PCR) 22
Hardware Bin Record (HBR) 23
Software Bin Record (SBR) 25
Pin Map Record (PMR) 27
Pin Group Record (PGR) 29
Pin List Record (PLR) 30
Retest Data Record (RDR) 32
Site Description Record (SDR) 33

Table of Contents
STDF Specification V4 Page ii
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Wafer Information Record (WIR) 35
Wafer Results Record (WRR) 36
Wafer Configuration Record (WCR) 38
Part Information Record (PIR) 40
Part Results Record (PRR) 41
Test Synopsis Record (TSR) 43
Parametric Test Record (PTR) 45
Multiple-Result Parametric Record (MPR) 51
Functional Test Record (FTR) 55
Begin Program Section Record (BPS) 60
End Program Section Record (EPS) 61
Generic Data Record (GDR) 62
Datalog Text Record (DTR) 64
STDF Filenames
STDF File Ordering
Storing Repair Information
Using the Pin Mapping Records
Differences Between STDF V3 and V4
Record Types
Data Types
Filename Characters
Required Records
Changes to Specific STDF Record Types
Glossary

Introduction to STDF
STDF Specification V4 Page 1
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Introduction to STDF
As the ATE industry matures, many vendors offer networking systems that complement the test
systems themselves and help customers get more out of their ATE investment. Many of these
networking systems are converging on popular standards, such as Ethernet.
A glaring hole in these standards has been the lack of test result data compatibility between test
systems of different manufacturers, and sometimes within the product lines of a single manufacturer.
Inordertohelpovercomethisproblem,Teradynehasdevelopedasimple,flexible,portabledataformat
to which existing data files and formats can be easily and economically converted. Called the Standard
Test Data Format (STDF), its specification is contained in the following document.
It is our hope that both users and manufacturers of semiconductor ATE will find this standard useful,
and will incorporate it into theirown operations and products.Teradyne has adopted this standard for
the test result output of all of its UNIX operating system based testers, and offers conversion
software for users of its Test System Director for our other semiconductor test systems. Teradyne
derives no direct commercial benefit from propagating this standard, but we hope its usefulness,
thoroughness, and full documentation will make all of us who work with ATE more productive.

Introduction to STDF
STDF Specification V4 Page 2
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Teradyne’s Use of the STDF Specification
The StandardTest Data Formatis intended as a comprehensive standardfor the entire ATEindustry,
not as a description of how Teradyne writes or analyzes test result data. A test system can support
STDF without using all the STDF record types or filling in all the fields of the record types it does use.
Similarly, when the specification says that an STDF record type can be used to create a certain report,
it cannot be assumed that Teradyne data analysis software always uses the record type to create its
reports. In addition, the statement that a field or record is required or optional applies only to the
definition of a valid STDF file; data analysis software may require a field that is declared optional in
the specification.
Forthisreason,theSTDFspecificationisnotthefinalreferenceonhow anypieceofTeradynesoftware
implements the specification.To determine how a Teradyne test systemfills in the STDF record types,
please refer to the documentation for that test system’s executive software. To determine what STDF
fields are used by a Teradyne data analysis tool, refer to the documentation for the data analysis
product.

STDF Design Objectives
STDF Specification V4 Page 3
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STDF Design Objectives
As ATE networking continues to emerge into a heterogeneous environment involving various
sophisticated computers and operating systems, it becomes necessary to define a common ground that
allows testers, database and database management systems, and data analysis software to store and
communicate test data in a form that is useful, general, and flexible.
The Standard Test Data Format (STDF) described in this document provides such a form. STDF is
flexible enough to meet the needs of the different testers that generate raw test data, the databases
that store the data, and the data analysis programs that use the data. The fact that it is a single,
coherent standard also facilitates the sharing and communicating of the data among these various
components of the complete ATE system.
STDFis not anattempt to specify a database architecturefor eithertestersor thecentralized database
engines. Instead, it is a set of logical record types. Because data items are described in terms of logical
recordtypes, therecord typescan be usedasthe underlying data abstraction,whether the data resides
in a data buffer, resides on a mass storage device, or is being propagated in a network message. It is
independent of network or database architecture. Furthermore, the STDF logical record types may be
treated as a convenient data object by any of the software, either networking or database, that may be
used on a tester or database engine.
Using a standard but flexible test data format makes it possible for a single data formatting program
running on the centralized database engine to accept data from a wide range of testers, whether the
testers come from one vendor or from different vendors or are custom-built by the ATE user. In
addition, adherence to a standard format permits the exporting of data from the central database and
data analysis engine to the user’s in-house network for further analysis in a form that is well
documented and thoroughly debugged. Finally, the standard makes it possible to develop portable
software for data reporting and analysis on both the testers and the centralized database engine.
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