In Praise of VLSI Test Principles and Architectures: Design for Testability
Testing techniques for VLSI circuits are today facing many exciting and complex challenges.
In the era of large systems embedded in a single system-on-chip (SOC) and fabricated in
continuously shrinking technologies, it is important to ensure correct behavior of the whole
system. Electronic design and test engineers of today have to deal with these complex and
heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study
the whole field in a detailed and deep way. This book provides an extremely broad knowledge
of the discipline, covering the fundamentals in detail, as well as the most recent and advanced
concepts.
It is a textbook for teaching the basics of fault simulation, ATPG, memory testing, DFT and
BIST. However, it is also a complete testability guide for an engineer who wants to learn the
latest advances in DFT for soft error protection, logic built-in self-test (BIST) for at-speed
testing, DRAM BIST, test compression, MEMS testing, FPGA testing, RF testing, etc.
Michel Renovell, Laboratoire d’Informatique, de Robotique et de Micro
´
electronique de
Montpellier (LIRMM), Montpellier, France
This book combines in a unique way insight into industry practices commonly found in
commercial DFT tools but not discussed in textbooks, and a sound treatment of the technical
fundamentals. The comprehensive review of future test technology trends, including self-
repair, soft error protection, MEMS testing, and RF testing, leads students and researchers
to advanced DFT research.
Hans-Joachim Wunderlich, University of Stuttgart, Germany
Recent advances in semiconductor manufacturing have made design for testability (DFT)
an essential part of nanometer designs. The lack of an up-to-date DFT textbook that covers
the most recent DFT techniques, such as at-speed scan testing, logic built-in self-test (BIST),
test compression, memory built-in self-repair (BISR), and future test technology trends, has
created problems for students, instructors, researchers, and practitioners who need to master
modern DFT technologies. I am pleased to find a DFT textbook of this comprehensiveness
that can serve both academic and professional needs.
Andre Ivanov, University of British Columbia, Canada
This is the most recent book covering all aspects of digital systems testing. It is a “must read”
for anyone focused on learning modern test issues, test research, and test practices.
Kewal K. Saluja, University of Wisconsin-Madison
Design for testability (DFT) can no longer be considered as a graduate-level course. With
growing design starts worldwide, DFT must be also part of the undergraduate curricu-
lum. The book’s focus on VLSI test principles and DFT architectures, while deemphasizing
test algorithms, is an ideal choice for undergraduate education. In addition, system-on-
chip (SOC) testing is one among the most important technologies for the development of
ultra-large-scale integration (ULSI) devices in the 21st century. By covering the basic DFT
theory and methodology on digital, memory, as well as analog and mixed-signal (AMS) test-
ing, this book further stands out as one best reference book that equips practitioners with
testable SOC design skills.
Yihe Sun, Tsinghua University, Beijing, China
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