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首页An introduction to mixed signal ic test and measurement
介绍混合信号集成电路测试和测量的经典书籍。 本书详细介绍了模拟和混合信号集成电路测试和测量方法,是第一本有关全面系统地介绍混合信号集成电路测试的专著。该书是根据作者多年的科研成果和教学实践,结合国际上关注的最新研究热点并参考大量的文献撰写的。本书共分为16章,内容包括混合信号测试概况、测试规范、直流和参数测量、测量精度、测试仪硬件、采样理论、基于DSP的测试、模拟通道测试、采样通道测试、聚焦校准、DAC测试、ADC测试、DIB设计、可测试性设计(DFT)、数据分析和测试经济学。 本书是面向电子工程的高年级本科生和研究生编写的,也可作为测试工程师的参考用书。本书要求读者具有模拟和数学电路、计算机编程、线性连续时间和离散时间系统、基本概率和统计概念、数字信号处理等基础知识。 影印版,没有“最清晰版”漏掉公式的问题
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An Introduction to
Mixed -Signal I C Test and Measurement
Mark Burns
Texas Instruments, Incorporated
Gordon W. Roberts
McGill University
New York Oxford
OXFORD UNIVERSITY PRESS
2001

Oxford University Press
Oxford New York
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Copyright @ 2001 by Texas Instruments, blcorporated
Published by Oxford University Press, Inc.
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http://www.oup-usa.org
Oxford is a registered trademark of Oxford University Press
All rights reserved. No part of this publication may be reproduced,
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without the prior permission of Oxford University Press.
Library of Congress Cataloging-in-Publication Data
Bums, Mark, 1962-
An introduction to mixed-signal IC test and measurement I Mark Bums, Gordon Roberts
p. cm. - (Oxford series in electrical and computer engineering)
Includes bibliographical references and index.
ISBN 0-19-514016-8
I. Integrated circuits-Testing. 2. Mixed signal circuits-Testing. I. Roberts, Gordon
W., 1959- II. Title. III. Series
TK7874 .B825 2000
621.38IS-dc2I
00-042770
Printing number: 9 8 7 6 5 4 3
Printed in the United States of America
on acid-free paper
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