Kent D. Lee
Steve Hubbard
Luther College
Decorah, IA
USA
ISSN 1863-7310 ISSN 2197-1781 (electronic)
ISBN 978-3-319-13071-2 ISBN 978-3-319-13072-9 (eBook)
DOI 10.1007/978-3-319-13072-9
Library of Congress Control Number: 2014953918
Springer Cham Heidelberg New York Dordrecht London
© Springer International Publishing Switzerland 2015
This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of
the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations,
recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or
information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar
methodology now known or hereafter developed. Exempted from this legal reservation are brief
excerpts in connection with reviews or scholarly analysis or material supplied specifically for the
purpose of being entered and executed on a computer system, for exclusive use by the purchaser of
the work. Duplication of this publication or parts thereof is permitted only under the provisions of the
Copyright Law of the Publisher’s location, in its current version, and permission for use must
always be obtained from Springer. Permissions for use may be obtained through RightsLink at the
Copyright Clearance Center. Violations are liable to prosecution under the respective Copyright Law.
The use of general descriptive names, registered names, trademarks, service marks, etc. in this
publication does not imply, even in the absence of a specific statement, that such names are exempt
from the relevant protective laws and regulations and therefore free for general use.
While the advice and information in this book are believed to be true and accurate at the date of
publication, neither the authors nor the editors nor the publisher can accept any legal responsibility for
any errors or omissions that may be made. The publisher makes no warranty, express or implied, with
respect to the material contained herein.
Printed on acid-free paper
Springer is part of Springer Science+Business Media (www.springer.com)
Series editor
Ian Mackie
Advisory Board
Samson Abramsky, University of Oxford, Oxford, UK
Karin Breitman, Pontifical Catholic University of Rio de Janeiro, Rio de Janeiro, Brazil
Chris Hankin, Imperial College London, London, UK
Dexter Kozen, Cornell University, Ithaca, USA
Andrew Pitts, University of Cambridge, Cambridge, UK
Hanne Riis Nielson, Technical University of Denmark, Kongens Lyngby, Denmark
Steven Skiena, Stony Brook University, Stony Brook, USA
Iain Stewart, University of Durham, Durham, UK
我的内容管理
展开
