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首页E7515A UXM综测仪测试LTE移动台射频一致性的详细指导
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Keysight Technologies
Performing LTE and LTE-Advanced
RF Measurements with the
E7515A UXM Wireless Test Set
Based on 3GPP TS 36.521-1
Application Note

02 | Keysight | Performing LTE and LTE-Advanced Measurements – Application Note
Contents
1 Introduction
2 LTE/LTE-Advanced RF Measurements with the UXM
3 Common Test Congurations
3.1 Environmental Conditions
3.2 Channel Bandwidths and Test Frequencies
3.3 Physical Connections
4 Transmitter Characteristics
4.1 Common Parameters for Transmitter Characteristics
4.2 Saving Common Parameters
4.3 Additional Test Conditions for Transmitter Characteristics
4.4 Example Test Procedure for UE Maximum Output Power (sc 6.2.2)
4.5 Example Test Procedure for Maximum Power Reduction (MPR) (sc 6.2.3)
4.6 Example Test Procedure for Additional Maximum Power Reduction (A-MPR) (sc 6.2.4)
4.7 Example Test Procedure for Congured UE Transmitted Power Output (sc 6.2.5)
4.8 Example Test Procedure for Minimum Output Power (sc 6.3.2)
4.9 Example Test Procedure for Transmit OFF Power (sc 6.3.3)
4.10 Example Test Procedure for General ON/OFF Time Mask (sc 6.3.4.1)
4.11 Example Test Procedure for PRACH Time Mask (sc 6.3.4.2.1)
4.12 Example Test Procedure for SRS Time Mask (sc 6.3.4.2.2)
4.13 Example Test Procedure for Power Control Absolute Power Tolerance (sc 6.3.5.1)
4.14 Example Test Procedure for Aggregate Power Control Tolerance (sc 6.3.5.3)
4.15 Example Test Procedure for Frequency Error (sc 6.5.1)
4.16 Example Test Procedure for Error Vector Magnitude (sc 6.5.2.1)
4.17 Example Test Procedure for PUSCH-EVM with Exclusion Period (sc 6.5.2.1A)
4.18 Example Test Procedure for Carrier Leakage (sc 6.5.2.2)
4.19 Example Test Procedure for In-Band Emissions for Non-Allocated RB (sc 6.5.2.3)
4.20 Example Test Procedure for EVM Equalizer Spectrum Flatness (sc 6.5.2.4)
4.21 Example Test Procedure for Occupied Bandwidth (sc 6.6.1)
4.22 Example Test Procedure for Spectrum Emission Mask (sc 6.6.2.1)
4.23 Example Test Procedure for Additional Spectrum Emission Mask (sc 6.6.2.2)
4.24 Example Test Procedure for Adjacent Channel Leakage Power Ratio (sc 6.6.2.3)
5 Receiver Characteristics without Carrier Aggregation
5.1 Overview of Receiver Characteristics without CA
5.2 Common Parameters for Receiver Characteristics without CA
5.3 Additional Test Conditions for Receiver Characteristics without CA
5.4 Example Test Procedure for Reference Sensitivity Level (c 7.3)
5.5 Example Test Procedure for Maximum Input Level (c 7.4)
5.6 Example Test Procedure for Adjacent Channel Selectivity (c 7.5)
5.7 Example Test Procedure for In-Band Blocking (sc 7.6.1)
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03 | Keysight | Performing LTE and LTE-Advanced Measurements – Application Note
6 Receiver Characteristics with Carrier Aggregation
6.1 Overview of Receiver Characteristics with DL CA
6.2 Common Parameters for Receiver Characteristics with DL CA
6.3 Additional Test Conditions for Receiver Characteristics with CA
6.4 Example Test Procedure. for Ref. Sens. Level for Interband DL CA w/o UL CA (sc 7.3A.3)
6.5 Example Test Procecure for Max. Input Level for Interband DL CA w/o UL CA (sc 7.4A.3)
7 References
8 Appendices
8.1 Test Channels for Transmitter and Receiver Characteristics
8.2 3GPP Measurement Congurations
8.3 Modulation and RB Allocation for Transmitter Characteristics without CA
8.4 Modulation and RB Allocation for Receiver Characteristics without CA
8.5 Troubleshooting RF Measurements
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04 | Keysight | Performing LTE and LTE-Advanced Measurements – Application Note
1 Introduction
The third-generation partnership project (3GPP) denes standards for development and
test of 3G and 4G system components. The technical specication (TS) 36.521-1 denes
requirements for radio frequency (RF) testing of long-term evolution (LTE) and LTE-
Advanced (LTE-A) user equipment (UE). This application note provides example test proce-
dures for RF testing of LTE and LTE-A UEs based on 3GPP TS 36.521-1 V12.2.0 (2014-06).
Many references are made to 3GPP TS 36.521-1 in this application note. In most cases,
these references are abbreviated as 36.521. References to other 3GPP documents are
abbreviated in a similar manner.
3GPP requires all tests to be performed over all E-UTRA bands supported by the UE.
In some cases, there are band-specic setups and requirements. This application note
provides example test procedures for frequency division duplex (FDD) E-UTRA Band 3.
Additional bands can be tested following a similar set of steps. E-UTRA bands are dened
in 36.521-1 clause 5.
3GPP also requires all tests to be performed over the lowest and highest channel band-
widths supported in each band. In addition, all tests must be performed with a channel
bandwidth of 5 MHz. There are bandwidth-specic setups and requirements as well. This
application note provides example test procedures for a channel bandwidth of 20 MHz.
Additional bandwidths can be tested following a similar set of steps. Channel bandwidths
for each E-UTRA band are dened in 36.521-1 clause 5.
In this application note from Keysight Technologies, Inc. example procedures use the
E7515A UXM wireless test set with E7630A LTE/LTE-A lab application (LA) software. The
software version is 1.2.1.0, released on 30 September 2014. Unless otherwise indicated,
E7530A LTE/LTE-A test application (TA) software can also be used with the example proce-
dures. Visit the Keysight UXM web page for detailed product information and access
to software downloads at www.keysight.com/nd/uxm.
3GPP denes specic requirements for RF testing, but RF design verication often requires
additional test congurations. Although this application note describes example procedures
based on 3GPP tests, the UXM also supports testing using non-standards-based
congurations with exible RB allocation and modulation setup, many graphical measure-
ment results and powerful measurement algorithms.
The UXM provides the tools needed to be condent about a device’s RF performance.
These include exible receiver test, trusted X-Series transmitter measurement science, and
network emulation. This enables conguration of dened conditions with varying frequen-
cies, power, and modulation, measurement to limits, and determination of the root-cause
of failures with reliable, repeatable results that can be automated and easily shared. Test
from early designs to nished products since the UXM supports both signaling and non-
signaling test, making it easy to “just connect.”
Keysight also provides fully automated and independently validated conformance solu-
tions that provide assured compliance to the latest version of 3GPP test specications. Visit
www.keysight.com/nd/systems for more information.

05 | Keysight | Performing LTE and LTE-Advanced Measurements – Application Note
Throughout this application note, selections and entries on the UXM front panel are shown
as follows.
Cell > Cong
This represents clicking on or touching the Cell lower tab, and then clicking on or touching
the Cong upper tab to enable access to the desired parameter setting or result.
Additionally, the words can represent actions using menu keys or active areas of the UXM
front panel. Here is one example.
Back > Back > Handover > Blind Handover
This represents clicking on or touching the Back, Handover, and Blind Handover menu
keys.
The test system conguration may include signicant losses due to cabling and use of
splitters or couplers external to the UXM. Compensation for external cable losses are
congured on the UXM Control Panel. Refer to the UXM User’s and Programmer’s Guide
for a description of how to specify cable loss. (See Section 7 of this application note.) The
LTE/LTE-A application controls whether cable loss compensation is enabled using the
System > Cong > Cable Loss Compensation setting. Note that this setting is non-volatile
and is not affected by a preset.
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