1056 JOURNAL OF DISPLAY TECHNOLOGY, VOL. 11, NO. 12, DECEMBER 2015
Performance Analysis of GaN-Based Light-Emitting
Diodes With Lattice-Matched InGaN/AlInN/InGaN
Quantum-Well Barriers
Naiyin Wang, Student Member, IEEE, Yi An Yin, Bijun Zhao, and Ting Mei, Senior Member, IEEE
Abstract—In this paper, the properties of GaN-based light-emit-
ting diodes (LEDs) with lattice-matched InGaN/AlIn
N/InGaN
(LM-IAI) quantum-well (QW) barriers are investigated numeri-
cally. Distributions of electrostatic field, carrier current density,
carrier concentration and radiative recombinati
on rate are simu-
lated, and internal quantum efficiency (IQE) and emission power
are calculated. The results show that the LEDs with LM-IAI
barriers have higher IQE and emission power ove
r their conven-
tional counterparts with GaN barriers due to the mitigation of
the quantum-confined Stark effect and the suppression of electron
leakage. Furthermore, the performance
s of the nitride-based
LEDs with the proposed barriers can be further improved by
dismissing the electron-blocking layer, which is attributed to
the improvement of hole injection effi
ciency and the decrease of
overall Auger recombination.
Index Terms—AlInN, light-emitting diodes (LEDs), multilayer
barrier, quantum efficiency (QE).
I. INTRODUCTION
I
MPROVING quantum efficiency (QE) is an eternal effort
for GaN-based light-emitting diodes (LEDs), since they
suffer from a severe efficiency droop and consequent low
QE at high drive current, which is a big obstacle for them to
be competitive in terms of high-brightness and high-power
applications as demanded in general lighting [1]–[3]. Among
the numerous mechanisms proposed, electron leakage [4],
[5], poor hole injection efficiency [6], [7], and Auger recom-
bination [8], [9] may play important roles for the problem.
The polarization field from spontaneous and piezoelectric
polarizations in the typical InGaN/GaN multiple quantum well
Manuscript received April 13, 2015; revised June 04, 2015; accepted June
07, 2015. Date of publication June 11, 2015; date of current version November
12, 2015. This work is financially supported by the National Natural Science
Foundation of China under Grant 61176085 and Grant 61377055 and by the
Department of Education of Guangdong Province, China under Grant gjhz1103.
(Corresponding author: Ting Mei and Yi An Yin.)
N. Wang, Y. A. Yin, and B. Zhao are with the Laboratory of Nanophotonic
Functional Materials and Devices, Institute of Optoelectronic Materialsand
Technology, South China Normal University, Guangzhou 510631, China
(e-mail: naiyin.wang.2015@ieee.org; yinya@scnu.edu.cn; bijunZhao@hot-
mail.com).
T. Mei is with the Key Laboratory of Space Applied Physics and Chem-
istry, Ministry of Education and Shanxi Key Laboratory of Optical Information
Technology, School of Science, Northwestern Polytechnical University, Xi’an
710072, China (e-mail: ting.mei@ieee.org).
Color versions of one or more of the figures are available online at http://
ieeexplore.ieee.org.
Digital Object Identifier 10.1109/JDT.2015.2444400
(MQW) active region leads to severe band bending, which
causes quantum-confined Stark effect (QCSE) and reduces
the confinement capability for carriers. More specifically, the
polarization field leads to spatial separation of electrons and
holes within quantum wells (QWs) and therefore reduces the
radiative recombination rate [10], [11]. The staggered QWs
[10], [11], semi/non-polar QWs [12], [13], and nanowire-based
structures [14] have been investigated to make electrons and
holes closer. On the other hand, the reduced confinement
capability for carriers aggravates the spill-over of electrons
out of the active region [4]. In fact, the electron leakage is a
common issue in nitride-based LEDs and it is the reason why
an AlGaN electron-blocking layer (EBL) was suggested [15].
However, recent studies indicated that the EBL's capacity of
blocking electron is insufficient due to the downward band
bending caused by polarization charges at GaN/AlGaN inter-
face and the utilization of that hinders the hole injection into
the active region [16]. Numerous efforts related to design of
barrier layers and EBLs in the heterostructures have been made
to alleviate the QCSE and enhance electron confinement and
hole injection efficiency, such as adoption of AlGaInN barriers
[17], large bandgap AlInN thin barriers [18]–[20], multilayer
InGaN-GaN-InGaN barriers [21], thin AlGaN barriers [22],
the AlInN EBL [23], the AlGaN/GaN superlattice EBL [24],
etc. Furthermore, Han et al. [16] reported experimentally that
InGaN/GaN MQW LEDs without EBL have higher QE at high
current than those with EBL due to the enhanced hole injection
efficiency. Besides, the investigation on the characteristics
of GaN-based LEDs without EBL can also be found in [22],
[25]–[27]. Very recently, Iveland et al. indicated that Auger
process is the dominant efficiency droop mechanism based on a
direct observation of Auger electrons emitted from GaN-based
LEDs under electrical injection [28]. This finding is in good
agreement with previously theoretical [29] and experimental
[8] studies. Likewise, many efforts have been made to reduce
Auger effect, including study of dilute-As GaNAs alloy with
potentially lower Auger recombination rate [30], [31], local
doping modulation [32], increase of the active layer thickness
[9], and replacement of conventional GaN barriers with thin
AlGaN barriers [22], etc.
Apart from the pursuit of the progress in material epitaxy
[33], [34], the design optimization of heterostructures is an
effective approach to improve the performance of III-Nitride
LEDs [17]–[27]. In this work, GaN-based LEDs with lat-
tice-matched InGaN/AlInN/InGaN (LM-IAI) quantum well
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