AOI 1310nm 激光器可靠性研究

需积分: 9 107 浏览量更新于2024-09-15 收藏 115KB PDF 举报

"这篇文档是AOI公司2003年关于1310nm‘蝴蝶’型DFB激光二极管可靠性的研究资料。AOI致力于提供业界最高质量标准的激光二极管，通过一系列严谨的质量管理和测试方法确保产品的一致性和可靠性。" 在信息技术领域，激光二极管（Laser Diode）是一种广泛应用于通信、数据存储和光学设备的关键组件。1310纳米（nm）的激光二极管在光纤通信中尤其常见，因为这个波长的光能有效穿透光纤，减少信号损耗。本文档特别关注的是1310nm的“蝴蝶”型DFB（分布反馈）激光二极管，这类封装设计因其外形类似蝴蝶翅膀而得名，通常用于提高热管理和光学性能。 AOI公司采用以下策略保证其产品的高质量和可靠性： 1. **ISO 9001:2000质量管理认证**：AOI遵循该国际标准建立并执行质量管理体系，确保制造过程的连贯性和一致性。他们持续改进这一系统，以满足不断提高的品质要求。 2. **严格的质量控制程序**：在开发阶段，激光芯片及其配套封装会经历一系列严格的测试，包括热应力、机械应力、老化测试和存储测试，以确保其在各种环境下的稳定性。 3. **故障率监测**：内部和现场的失败率会被持续监控，以便通过模型评估整体预期的故障率，从而及时调整生产和设计。 4. **生产中的可靠性测试**：通过抽样程序对代表性设备进行可靠性测试，以验证生产线上设备的性能。 5. **功能测试和烧录测试**：所有生产出的设备都会进行功能测试，确保符合特定应用或客户规格。同时，100%的设备会进行烧录测试，这是一种加速老化测试，以检验设备在长期工作条件下的稳定性。 DFB激光二极管因其独特的分布式反馈结构，在激光光源中具有高边模抑制比和窄线宽等优点，适用于长距离通信和高精度测量。这份文档详细描述了AOI如何确保这些高性能激光二极管的可靠性和一致性，对于理解激光二极管的制造工艺、测试流程以及在通信行业的应用具有重要价值。

1310-nm “Butterfly”-style DFB Laser Diode Reliability Study

GENERAL INFORMATION

AOI is committed to supplying laser diodes meeting the highest quality standards in the

industry. The consistent reliability and quality of our devices is maintained by the

following methods:

1. AOI’s ISO9001:2000-registered Quality Management System ensures proper

procedures are in place to maintain consistency in the manufacturing process. AOI is

committed to continually improving our QMS.

2. During development, laser chips and their associated packages are subjected to

exhaustive quality control procedures, including thermal stress, mechanical stress,

aging, and storage tests.

3. Internal and field-failure rates are continually monitored to ensure the adequacy of

our models in determining overall expected failure rates.

4. During production, reliability testing is performed on representative devices using a

sampling program.

5. Functional testing appropriate to the intended application and/or customer

specifications and burn-in testing are performed on 100% of the devices produced by

AOI.

OVERVIEW

The basic lasers covered by this test report are AOI’s series of 1310-nm Distributed

Feedback (DFB) laser diodes in 14-pin “butterfly” style packages. Part numbers include

the entire DFB-1xxx-BF-series.

CHIP STRUCTURE

AOI’s DFB laser chips utilize state-of-the-art Molecular Beam Epitaxy (MBE) growth

processes in their fabrication. The MBE process is capable of reproducibly growing

single-crystal semiconductor layers as thin as 2 Angstroms (200 Trillionths of a meter).

AOI’s laser chips are grown on Indium Phosphide (InP) substrates, utilizing and advanced

Indium-Gallium-Arsenide (InGaAs) multiple quantum-well (MQW) structure.

All AOI laser chips are fabricated internally at AOI. Devices are individually marked and

tracked by serial number from the wafer level through the finished device. All testing

steps are computer-controlled and automatically data-logged for statistical analysis and

failure mode analysis.

PRODUCTION TESTING

AOI’s devices are subjected to intensive screening and monitoring before shipment to the

customer. All devices are shipped with an individual test report detailing all relevant

performance measurements required in the product specifications. The format and

content of the test report will vary depending on product specifications and intended

application, but a certain test procedures are common to all AOI laser devices.

A multiple-stage burn-in is used for all devices. The devices are operated at an ambient

temperature in excess of the maximum rated temperature for the device. This step

下载后可阅读完整内容，剩余4页未读，立即下载

meng13040288299

粉丝: 0
资源: 8

AOI 1310nm 激光器可靠性研究

培训资料AOI简介.ppt.ppt

Python实现的AOI aoi.py

AOI硬体学习资料

AB PLC AOI平台学习资料分享

solar-AOI-Test.zip_AOI_AOI光源测试_labview 测试_labview AOI_solar aoi

aoi:带lua的简单aoi

sherlock_aoi.rar_AOI_AOI C#_Sherlock7 C#_aoi__sherlock c#

AOI_homework

AOI光学测试

AOI图像处理

最新资源