"2022年半导体器件地基宇宙射线诱导破坏效应测试程序"

The JEDEC JEP151A 2022 Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices is a comprehensive document published by the JEDEC Solid State Technology Association. This revised version of the previous JEP151 from December 2015 provides detailed guidelines on how to measure the destructive effects of terrestrial cosmic rays on power semiconductor devices. The test procedure outlined in this document has been thoroughly researched, reviewed, and approved by the JEDEC Board of Directors to ensure its accuracy and reliability. It is designed to help manufacturers and researchers accurately assess the impact of cosmic ray-induced effects on power semiconductor devices, allowing them to develop more robust and reliable products for various applications. The document covers a wide range of test methods and techniques to measure the destructive effects of terrestrial cosmic rays, including detailed guidelines on test setup, data collection, analysis, and interpretation. It also provides recommendations on how to mitigate the impact of cosmic rays on power semiconductor devices through design improvements and protective measures. Overall, the JEDEC JEP151A 2022 Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices serves as a valuable resource for the semiconductor industry, helping to ensure the reliability and performance of power semiconductor devices in the face of cosmic ray-induced effects. Manufacturers and researchers can rely on this document to conduct accurate and informative tests to evaluate and improve the durability of their products in challenging environments.