优化的窄带反射滤波器设计与多通道应用

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"该研究探讨了一种具有多通道的窄带反射滤波器设计，主要应用于光学通信系统。文中提出了一种由介电层和金属层组成的高反射滤波器，通过优化设计实现了带有宽截止带的阻抗匹配层。这种结构可表示为Sub j (HL)13H2L(HL)313Cr0.84H j air，其全半值宽带宽（FWHM）为2.5纳米。基于此结构，可以设计出具有多个峰值的反射滤波器，并且描绘了峰值位置的分布规律。" 在光学通信和其他系统中，反射滤波器扮演着至关重要的角色。本文介绍的是一种创新的窄带高反射滤波器设计，它结合了介电材料和金属材料的特性，以实现特定的光学功能。滤波器的设计采用了优化算法，目的是在宽截止带内达到最佳的阻抗匹配，以提高反射效率并减少信号损失。具体的结构配置为Sub j (HL)13H2L(HL)313Cr0.84H j air，这里的 HL 和 H 分别代表交替的高折射率和低折射率层，Cr 表示金属层，而空气层则用 air 表示。这个设计的独特之处在于其能够在非常窄的带宽（2.5纳米的FWHM）内实现高效反射。进一步的研究中，基于上述基本结构，研究人员展示了如何构建具有多个峰值的反射滤波器。这些多峰值滤波器可以在不同的波长上提供高反射，这对于光通信中的多信道分复用和信号分离具有重要意义。此外，他们还分析了这些峰值在波长空间中的分布规律，这有助于理解和控制滤波器的响应特性，从而在实际应用中实现更精细的信号控制和处理。 OCIS（Optical and Quantum Communications, Information Science, and Instrumentation Systems）代码未给出，但通常这类代码会与文章研究的主题和领域相关，可能包括光学通信、量子通信、信息科学以及光学仪器系统等方向。这表明该研究可能对这些领域的理论和实践都具有一定的贡献。这项工作为光学通信系统的滤波技术带来了新的进展，通过设计多通道窄带反射滤波器，提升了信号处理的精度和效率，对于未来高速、大容量的光通信网络有着潜在的应用价值。

1102 CHINESE OPTICS LETTERS / Vol. 8, No. 11 / Novemb er 10, 2010

Study of a narrowband reﬂection f ilter with multi-channels

Hongfei Jiao (焦焦焦宏宏宏飞飞飞)

1,2∗

, Tao Ding (丁丁丁涛涛涛)

, Xinbin Cheng (程程程鑫鑫鑫彬彬彬)

Bin Ma (马马马彬彬彬)

1,2

, Pengfei He (贺贺贺鹏鹏鹏飞飞飞)

, and Yonggang Wu (吴吴吴永永永刚刚刚)

Institute of Precision Optical Engineering, Department of Physics, Tong ji University, Shanghai 200092, China

Scho ol of Aerospace Engineering and Applied Mechanics, Tongji University, Shanghai 200092, China

∗

E-mail: jiaohf@tong ji.edu.cn

Received March 3, 2010

Reﬂection filters have various applications in optical communication and other systems. In this letter,

we propose a narrowband high-reﬂection filter composed of dielectric and metallic layers, in which an

optimized filter combined with an admittance-matching layer with broad stop band is achieved. The

structure can be expressed as Sub | (HL)

H2L(HL)

13Cr0.84H | air, with full-width at half-maximum

(FWHM) bandwidth of 2.5 nm. Based on this structure, reﬂection filters with multi-peaks are presented,

and the law of distribution of p eak positions is drawn.

OCIS co des: 310.6860, 230.7408, 220.0220.

doi: 10.3788/COL20100811.1102.

Interference filters have a huge prospect of being applied

in the fields of optical communication, space engineer-

ing, industrial detection

[1−6]

, and so on. Filters with

multiple channels are especially fascinating in a dense

wavelength division multiplexing (DWDM) system; such

filters are called transmittance filters. Likewise, reﬂec-

tion filters also have various applications in fields such

as special photography and communication systems

[7,8]

Considerable research has been done on the design and

fabrication of reﬂection filter. For instance, Thelen pro-

posed an all-dielectric minus filter

[9]

, while Wang et al.

presented a multi-peak reﬂection filter using guided res-

onant gratings

[10]

. Sheng et al. designed a reﬂection

filter by alternately superimp osing metal and dielec-

tric layers

[11]

, and Robin et al. produced a reﬂectance

filter with a metal/dielectric/metal structure

[7,12]

. How-

ever, these filters are difficult to fabricate because of

their complicated non-period structures. Sun et al. re-

cently proposed a new structure by adding one metal

layer to a period dielectric film stack, which is easier to

fabricate

[13,14]

In this letter, a new structure based on Sun’s model

is proposed; it has improved spectral characteristics

through the addition of a suitable matching layer. In

addition, further investigation on multi-channel and in-

tegrated reﬂection filters is carried out.

We chose the structure Sub | (HL)

H2L(HL)

αCr |

air, which was proposed by Sun et al.

[13]

, as the starting

structure for optimization. In the structure, Sub means

substrate, H represents a dielectric layer (TiO

) with as-

sumed high refractive index value of 2.16; L is a dielectric

layer (SiO

) with assumed low refractive index value of

1.46; the optical thickness of the corresponding layer is

equal to one quarter of the desired central wavelength.

We assume that the refractive index for the substrate is

1.52. The refractive indices of Cr are adopted from the

handbo ok of Palik

[15]

and are described in Table 1. The

physical thickness of the metal Cr layer is represented by

α. The designed wavelength is 700 nm.

The structure (HL)

H2L(HL)

is similar to the Fabry-

Perot (F-P) mirror, which we call quasi-F-P in this let-

ter. Assuming (HL)

H and (HL)

to be the first and

the second mirrors, respectively, they play different roles

in the filter; this has been discussed in part in previous

studies

[14,16]

. Figure 1(a) shows the reﬂectance spectra,

wherein n is equal to 3 with different m values of 6, 7, 8,

and 9. Figure 1(b) shows the case of fixed m = 6 with

varying n values of 2, 3, 4, and 5. Figure 1(c) shows the

case of fixed m = 9 with varying n values of 2, 3, 4, and

5. The insets are enlarged drawing of the peaks. The

result shows that there is a need to increase the value

of m in order to improve the height of the peaks. It

is also shown that the bandwidth will become narrower

when the value of n is increased. However, the value of

n cannot be too big; it should be less than the value of

m to maintain a sufficiently high reﬂectance at the cen-

tral wavelength. Moreover, with increasing value of n,

the curve distributed around the central wavelength will

become more unstable, leading to a poor cut-off band.

Thus, there is a need to choose a suitable parameter to

achieve the required results.

Figure 2 shows the reﬂectance and absorptance spectra

of the filter: Sub | (HL)

H2L(HL)

αCr | air; the inset is

an enlarged drawing of the peaks. It can be seen that the

reﬂectance curve of the stop band b ecomes ﬂatter as the

thickness of the Cr layer increases. However, the height of

the reﬂectance at the central wavelength remains almost

unchangs. It can also be seen that the absorptance at the

central wavelength is kept at the minimum throughout,

while the other curves around the central wavelength

become ﬂatter. From these observations, it can be said

that there is a need to find the suitable thickness of

the Cr layer that will enable the filter to have a better

Table 1. Refractive Index n and Extinction

Coeﬃcient k of Cr Thin Films

Wavelength (nm) 490.1 512.3 532.1 558.5 582.1

n 2.49 2.75 2.98 3.18 3.34

k 4.44 4.46 4.45 4.41 4.38

Wavelength (nm) 610.8 700.5 815.7 826.6 849.2

n 3.48 3.84 4.23 4.27 4.31

k 4.36 4.37 4.34 4.33 4.32

1671-7694/2010/111102-04

° 2010 Chinese Optics Letters

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