Datasheet 8 Rev. 1.00
2019-04-25
PROFET™+ 24V
BTF6070-2ERV
General Product Characteristics
Notes
1. Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Sense Pin
Voltage at IS pin V
IS
-0.3 - V
S
V - P_4.1.19
Current through IS pin I
IS
-25 - 50 mA - P_4.1.20
Power Stage
Load current | I
L
|--I
L(LIM)
A - P_4.1.21
Power dissipation (DC) P
TOT
--1.8W T
A
= 85°C
T
J
< 150°C
P_4.1.22
Maximum energy dissipation
repetitive pulse (one channel)
E
AR_2A
--40mJ20 Mio. cycles
I
L(0)
= 2 A
T
J(0)
= 105°C
P_4.1.24
Negative voltage slope at output
(inductive clamping)
-dV
OUT
/dt---20V/µs
1)
V
OUT
= 28 V
to 28 V - V
DS(AZ)
V
IN
= 0 V
P_4.1.35
Positive voltage slope at output dV
OUT
/dt - - 20 V/µs
1)
V
OUT
= 0 V to 28 V
V
IN
= 0 V
P_4.1.36
Voltage at power transistor V
DS
--65V - P_4.1.26
Currents
Current through ground pin I
GND
-20 - 20 mA - P_4.1.27
Current through ground pin I
GND
-150 - 20 mA t < 2 min P_4.1.7
Temperatures
Junction temperature T
J
-40 - 150 °C - P_4.1.28
Storage temperature T
STG
-55 - 150 °C - P_4.1.30
ESD Susceptibility
ESD susceptibility (all pins) V
ESD
-2 - 2 kV
4)
HBM P_4.1.31
ESD susceptibility OUT Pin vs.
GND and V
S
connected
V
ESD
-5 - 5 kV
4)
HBM P_4.1.32
ESD susceptibility V
ESD
-500 - 500 V
5)
CDM P_4.1.33
ESD susceptibility pin (corner
pins)
V
ESD
-750 - 750 V
5)
CDM P_4.1.34
1) Not subject to production test. Specified by design
2) V
S(LD)
is setup without the DUT connected to the generator per ISO 7637-1
3) Threshold limit for short circuit failures: 100 ppm. Please refer to the legal disclaimer for short-circuit capability on
the Back Cover of this document
4) ESD susceptibility, Human Body Model “HBM” according to AEC Q100-002
5) ESD susceptibility, Charged Device Model “CDM” according to AEC Q100-011
Table 3 Absolute Maximum Ratings
1)
T
J
= -40°C to 150°C; (unless otherwise specified)
Parameter Symbol Values Unit Note or
Test Condition
Number
Min. Typ. Max.
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