固态存储性能测试规范2.0.2：NAND闪存的准确可比测试方法、套件和报告格式

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SSS-PTS 2.0.0是一种用于固态存储设备级性能测试的方法、测试套件和报告格式。该规范的目的是为客户端和企业应用程序提供基于NAND闪存的固态存储产品的准确、可重复和可靠的比较。该规范描述了一种针对固态存储设备的性能测试方法，包括测试套件和报告格式。通过使用这些测试工具和方法，可以对各种形态、协议和接口的基于NAND闪存的固态存储产品进行比较。在客户端和企业应用程序中，对固态存储设备的性能有着严格的要求。因此，为了准确地评估不同产品之间的差异，需要一种有效的测试方法和工具。SSS-PTS 2.0.0规范提供了这样一种方法，能够提供可靠的比较数据。该规范的发布和批准由SNIA（存储网络产业协会）负责。SNIA是一个全球性的组织，致力于推动存储网络技术的发展和标准化。通过SNIA的认可，SSS-PTS 2.0.0规范得到了业界的广泛认可和使用。 SSS-PTS 2.0.0规范涵盖了固态存储设备的不同方面，包括形态、协议和接口。形态方面，涵盖了各种不同的固态存储产品，包括SSD（固态硬盘）、UFS（通用闪存存储器）和eMMC（嵌入式多媒体卡）。协议方面，覆盖了各种不同的存储协议，包括SATA（串行ATA）、NVMe（非易失性内存表达）和SAS（串行连接SCSI）。接口方面，涵盖了各种不同的设备接口，包括PCIe（外设组件互连快速通道）、SATA和USB（通用串行总线）。 SSS-PTS 2.0.0规范明确了测试方法和流程，以确保测试结果的准确性和可重复性。规范中提供了详细的测试步骤和指南，包括测试环境的设置、测试数据的采集和处理、测试指标的计算和报告的生成。通过使用SSS-PTS 2.0.0规范提供的测试套件和报告格式，可以对不同固态存储产品的性能进行全面而准确的比较。测试套件涵盖了各种常见的性能指标，包括读写速度、随机访问时间、数据完整性和可靠性等。报告格式清晰明了，提供了详细的测试结果和分析，方便用户对不同产品进行评估和选择。总之，SSS-PTS 2.0.0规范为客户端和企业应用程序提供了一种准确、可重复和可靠的比较基于NAND闪存的固态存储产品的方法和工具。通过遵循该规范，用户可以更好地了解和评估不同产品之间的差异，选择最适合自己需求的固态存储设备。该规范的发布和认可由SNIA负责，进一步证明了它的可信度和实用性。使用SSS-PTS 2.0.0规范可以提高存储设备的性能，并最大程度地提升系统的效率和可靠性。

SSS PTS SNIA Standard 16

Version 2.0.2

2 Definitions, symbols, abbreviations, and conventions

2.1 Definitions

2.1.1 ActiveRange: Specified as ActiveRange(start:end), where “start” and “end” are

percentages. ActiveRange (AR) is the range of LBA’s that may be accessed by the pre-

conditioning and/or test code, where the starting LBA# = start%*MaxUserLBA and the

ending LBA# = end%*MaxUserLBA.

2.1.2 Cache: A volatile or non-volatile data storage area outside the User Capacity that may

contain a subset of the data stored within the User Capacity.

2.1.3 Client: Single user desktop or laptop system used in home or office.

2.1.4 CPU Usage: amount of time for which a central processing unit (CPU) is used for

processing instructions. CPU time is also measured as a percentage of the CPU's

capacity at any given time.

2.1.5 Data Excursion: As used in the definition of Steady State, shall be measured by taking

the absolute value of the difference between each sample and the average.

2.1.6 Enterprise: Servers in data centers, storage arrays, and enterprise wide / multiple user

environments that employ direct attached storage, storage attached networks and tiered

storage architectures.

2.1.7 Client: laptop or desktop computers used in small office, home, mobile, entertainment

and other single user applications.

2.1.8 Fresh Out of the Box (FOB): State of SSS prior to being put into service.

2.1.9 IO Demand: Measured # of OIOs executing in the host.

2.1.10 Logical Block Address (LBA): The address of a logical block, i.e., the offset of the block

from the beginning of the logical device that contains it.

2.1.11 Latency: The time between when the workload generator makes an IO request and when

it receives notification of the request’s completion.

2.1.12 MaxUserLBA: The maximum LBA # addressable in the User Capacity.

2.1.13 Measurement Window: The interval, measured in Rounds, during which test data is

collected, bounded by the Round in which the device has been observed to have

maintained Steady State for the specified number of Rounds (Round x), and five Rounds

previous (Round x-4).

2.1.14 Nonvolatile Cache: A cache that retains data through power cycles.

2.1.15 Outstanding IO (OIO): The number of IO operations issued by a host, or hosts, awaiting

completion.

2.1.16 OIO/Thread: The number of OIO allowed per Thread (Worker, Process)

2.1.17 Over-Provisioned Capacity: LBA range provided by the manufacturer for performance

and endurance considerations, but not accessible by the host file system, operating

system, applications, or user.

2.1.18 Pre-conditioning: The process of writing data to the device to prepare it for Steady State

measurement.

(a) Workload Independent Pre-conditioning (WIPC): The technique of running a

prescribed workload, unrelated to the test workload, as a means to facilitate convergence

to Steady State.

(b) Workload Dependent Pre-conditioning (WDPC): The technique of running the test

workload itself, typically after Workload Independent Pre-conditioning, as a means to put

SSS PTS SNIA Standard 17

Version 2.0.2

the device in a Steady State relative to the dependent variable being tested.

2.1.19 Pre-conditioning Code: Refers to the Pre-conditioning steps set forth in this

Specification.

2.1.20 Purge: The process of returning an SSS device to a state in which subsequent writes

execute, as closely as possible, as if the device had never been used and does not contain

any valid data.

2.1.21 Round: A complete pass through all the prescribed test points for any given test.

2.1.22 Queue Depth: Interchangeably refers to the OIO/Thread produced by the Workload

Generator.

2.1.23 Slope: As used in the definition of Steady State, shall mean the slope of the “Best Linear

Fit Line.”

2.1.24 Steady State: A device is said to be in Steady State when, for the dependent variable (y)

being tracked:

a) Range(y) is less than 20% of Ave(y): Max(y)-Min(y) within the Measurement Window

is no more than 20% of the Ave(y) within the Measurement Window; and

b) Slope(y) is less than 10%: Max(y)-Min(y), where Max(y) and Min(y) are the maximum

and minimum values on the best linear curve fit of the y-values within the Measurement

Window, is within 10% of Ave(y) value within the Measurement Window.

2.1.25 Test Code: Refers to the measurement steps set forth in the test sections contained in

this Specification.

2.1.26 Transition Zone: A performance state where the device’s performance is changing as it

goes from one state to another (such as from FOB to Steady State).

2.1.27 Thread: Execution context defined by host OS/CPU (also: Process, Worker)

2.1.28 Thread Count (TC): Number of Threads (or Workers or Processes) specified by a test.

2.1.29 Total OIO: Total outstanding IO Operations specified by a test = (OIO/Thread) * (TC)

2.1.30 User Capacity: LBA range directly accessible by the file system, operating system and

applications, not including Over-Provisioned Capacity.

2.1.31 Volatile Cache: A cache that does not retain data through power cycles.

2.2 Acronyms and Abbreviations

2.2.1 IOPS: I/O Operations per Second

2.2.2 DUT: Device Under Test

2.2.3 DI: Demand Intensity (aka Total OIO)

2.2.4 FOB: Fresh Out of Box

2.2.5 OIO: Outstanding IO

2.2.6 TOIO: Total Outstanding IO

2.2.7 RND: Random

2.2.8 R/W: Read/Write

2.2.9 SEQ: Sequential

2.2.10 SSSI: Solid State Storage Initiative

2.2.11 SSS TWG: Solid State Storage Technical Working Group

2.2.12 TC: Thread Count

2.2.13 ART: Average Response Time

SSS PTS SNIA Standard 18

Version 2.0.2

2.2.14 QD: Queue Depth

2.2.15 TP: Throughput

2.2.16 LAT: Latency

2.2.17 WSAT: Write Saturation

2.2.18 HIR: Host Idle Recovery

2.2.19 XSR: Cross Stimulus Recovery

2.2.20 ECW: Enterprise Composite Workload

2.2.21 DIRTH: Demand Intensity / Response Time Histogram

2.2.22 TC/QD Sweep: Thread Count / Queue Depth Sweep, aka DIRTH test

2.3 Keywords

The key words “shall”, “required”, “shall not”, “should”, “recommended”, “should not”, “may”, and

“optional” in this document are to be interpreted as:

2.3.1 Shall: This word, or the term "required", means that the definition is an absolute

requirement of the specification.

2.3.2 Shall Not: This phrase means that the definition is an absolute prohibition of the

specification.

2.3.3 Should: This word, or the adjective "recommended", means that there may be valid

reasons in particular circumstances to ignore a particular item, but the full implications

must be understood and weighed before choosing a different course.

2.3.4 Should Not: This phrase, or the phrase "not recommended", means that there may

exist valid reasons in particular circumstances when the particular behavior is

acceptable or even useful, but the full implications should be understood and the case

carefully weighed before implementing any behavior described with this label.

2.3.5 May: This word, or term “optional”, indicates flexibility, with no implied preference.

2.4 Conventions

2.4.1 Number Conventions

Numbers that are not immediately followed by lower-case b or h are decimal values.

Numbers immediately followed by lower-case b (xxb) are binary values.

Numbers immediately followed by lower-case h (xxh) are hexadecimal values.

Hexadecimal digits that are alphabetic characters are upper case (i.e., ABCDEF, not abcdef).

Hexadecimal numbers may be separated into groups of four digits by spaces. If the number is not

a multiple of four digits, the first group may have fewer than four digits (e.g., AB CDEF 1234

5678h).

Storage capacities and data transfer rates and amounts shall be reported in Base-10. IO transfer

sizes and offsets shall be reported in Base-2. The associated units and abbreviations used in this

specification are:

•

A kilobyte (KB) is equal to 1,000 (10

) bytes.

•

A megabyte (MB) is equal to 1,000,000 (10

) bytes.

•

A gigabyte (GB) is equal to 1,000,000,000 (10

) bytes.

•

A terabyte (TB) is equal to 1,000,000,000,000 (10

) bytes.

•

A petabyte (PB) is equal to 1,000,000,000,000,000 (10

) bytes

•

A kibibyte (KiB) is equal to 2

bytes.

•

A mebibyte (MiB) is equal to 2

bytes.

SSS PTS SNIA Standard 20

Version 2.0.2

3 Key Test Process Concepts

The performance of an SSS device is highly dependent on its prior usage, the pre-test state of

the device and test parameters. This section describes key SSS test methodology concepts.

3.1 Steady State

SSS devices that are Fresh Out of the Box (FOB), or in an equivalent state, typically exhibit a

transient period of elevated performance, which evolves to a stable performance state relative to

the workload being applied. This state is referred to as a Steady State (Definition 2.1.24).

It is important that the test data be gathered during a time window when the device is in Steady

State, for two primary reasons:

1) To ensure that a device’s initial performance (FOB or Purged) will not be reported as

“typical”, since this is transient behavior and not a meaningful indicator of the drive’s

performance during the bulk of its operating life.

2) To enable Test Operators and reviewers to observe and understand trends. For example,

oscillations around an average are “steady” in a sense, but might be a cause for concern.

Steady State may be verified:

• by inspection, after running a number of Rounds and examining the data;

• programmatically, during execution; or

• by any other method, as long as the attainment of Steady State, per Definition 2.1.24, is

demonstrated and documented.

Steady State as defined in Definition 2.1.24 shall meet the Steady State Verification criteria as

set forth in each test. Steady State reporting requirements are covered in the respective test

sections.

3.2 Purge

The purpose of the Purge process (Definition 2.1.18) is to put the device in a consistent state prior

to pre-conditioning and testing, and to facilitate a clear demonstration of Steady State

convergence behavior.

Purge shall be run prior to each pre-conditioning and testing cycle. If the device under test does

not support any kind of Purge method, and the Test Operator chooses to run the PTS, the fact

that Purge was not supported/run must be documented in the test report.

The Test Operator may select any valid method of implementing the Purge process, including,

but not limited to, the following:

a) ATA: SECURITY ERASE, SANITIZE DEVICE (BLOCK ERASE EXT)

b) SCSI: FORMAT UNIT

c) NVMe: FORMAT namespace

d) Vendor specific methods

The Test Operator shall report what method of Purge was used.

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