Design For Test翻译

Design for Test (DFT)是一种软件工程实践，其核心理念是在系统设计阶段就充分考虑测试需求，以简化后续的测试工作并提高测试效率。DFT强调在编码之前，开发者会考虑到系统的可测试性，通过结构化的设计、模块化的划分、以及预留必要的测试接口和数据输入点等手段，使得系统更易于验证功能正确性和发现潜在的问题。

一些关键策略包括：
1. 易于访问的内部状态：保证测试人员可以方便地查看和修改内部变量。
2. 断点和日志：在关键位置设置断点，便于调试；记录详细的日志信息供测试分析。
3. 预期结果的明确性：每个组件或函数都有清晰的行为描述，方便测试检查。

DFT有助于早期发现和修复缺陷，减少后期维护的成本，并提升产品质量。

相关问题

design for test C6 VIOLATION

A C6 violation occurs when two or more cells in a circuit are connected in such a way that they share a common node, but their outputs are not intended to be logically equivalent. This can cause unpredictable behavior and is a serious design flaw that must be avoided.

To test for C6 violations, you can use the following approach:

1. Identify all the cells in the circuit that share a common node.
2. Determine the intended output values for each of these cells.
3. Generate test vectors that drive the inputs of each cell in a way that will cause the outputs to violate the intended values.
4. Apply the test vectors to the circuit and observe the outputs.
5. If any of the outputs violate the intended values, then a C6 violation has been detected.

To prevent C6 violations from occurring in the first place, you should ensure that cells with different intended output values are not connected to the same node. You can also use design rules and guidelines to help identify potential C6 violations during the design process.

什么是design for test

Design for test (DFT)是一种设计方法，用于确保芯片或系统设计的可测试性和可靠性。它包括在设计阶段考虑测试和诊断的需要，以便在制造和运营过程中能够进行有效的测试和故障排除。具体来说，DFT包括添加测试电路、测试点和测试模式，以便可以检测和诊断芯片中的故障。通过使用DFT，可以减少产品制造和维修的成本，提高产品质量和可靠性。