Pitfalls and Tradeoffs in Simultaneous, On-Chip FPGA Delay Measurement
时间: 2024-06-07 11:10:12 浏览: 9
Simultaneous, on-chip FPGA delay measurement is a useful technique for characterizing the delay of digital circuits. However, there are several pitfalls and tradeoffs that should be considered when using this technique.
One common pitfall is the assumption that the delay of a circuit is constant across different input patterns. In reality, the delay can vary depending on the input pattern. Therefore, it is important to measure the delay across a range of input patterns to obtain an accurate characterization.
Another pitfall is the assumption that the delay of a circuit is symmetric for rising and falling edges. This is not always the case, especially for circuits with non-linear input/output characteristics. Asymmetry can result in errors in the delay measurement, so it is important to measure the delay for both rising and falling edges.
Tradeoffs that must be considered include the tradeoff between measurement accuracy and measurement time. To obtain a more accurate measurement, it may be necessary to measure the delay multiple times and average the results. However, this can increase the measurement time, which may not be feasible in some applications.
Another tradeoff is between measurement accuracy and the complexity of the measurement circuitry. More complex measurement circuitry can provide more accurate measurements, but it can also increase the cost and complexity of the overall system.
In summary, simultaneous, on-chip FPGA delay measurement is a useful technique for characterizing digital circuits, but it is important to consider the pitfalls and tradeoffs when using this technique.
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