1.2
Basic
Concepts
3
The
required function
specifies the item's task.
For example, for given
inputs, the item outputs have to be constrained within specified
tolerance bands
(performance Parameters should still be given with tolerances and not merely as
fixed values). The definition of the required function is the starting point for
any
reliabili9 analysis,
as it defines
failures.
Operating conditions
have an important influence upon reliability, and must
therefore be specified with care. Experience shows e.g., that the failure rate of
semiconductor devices will double for operating temperature increase of
10
-
20°C .
The required function andl or operating conditions can be
time dependent.
In these cases, a
mission profile
has to be defined and all reliability figures will be
related to it.
A
representative mission profile and the corresponding reliability
targets should be given in the
item's specification
Often the mission duration is considered as a Parameter
t,
the
reliabilityfunction
is then defined by
R(t). R(t)
is the probability that no failure at item level will
occur in the interval
(0,
t].
The item's condition at
t
=
0
(new or not) influences
final results. To consider this, reliability figures at system level will have indices
Si
(e.g.
Rs,(t)),
where
S
stands for system and
1
is the state entered at
t
=
0
(Table 6.2).
A
distinction between
predicted
and
estimated
or
assessed
reliability is
important. The first one is calculated on the basis of the item's reliability structure
and the failure rate of its components (Sections
2.2
&
2.3), the second is obtained
from a statistical evaluation of reliability tests (Section
7.2)
or from field data by
known environmental and operating conditions.
The concept of reliability can be extended to processes and services as well,
although
human aspects
can lead to modeling difficulties (see e.g. Section 1.2.7).
1.2.2
Failure
A
failure
occurs when the item stops performing its required function. As simple as
this definition is, it can become difficult to apply it to complex items. The
failure-
free time
(hereafter used as a synonym for
failure-free operating time)
is generally a
random variable.
It is often reasonably long, but it can be very short, for instance
because of a failure caused by a transient event at turn-on.
A
general assumption in
investigating failure-free times is that at
t
=
0
the item is free of
defects
and
systematic failures.
Besides their
frequency,
failures should be classified (as far as
possible) according to the mode, cause, effect, and mechanism:
1.
Mode:
The mode of a failure is the
Symptom
(local effect) by which a failure
is observed; e.g., Opens, shorts, or drift for electronic components (Table
3.4);
brittle rupture, creep, cracking, seizure, fatigue for mechanical components.
2.
Cause:
The cause of a failure can be
intrinsic,
due to weaknesses in the item
andlor wearout, or
extrinsic,
due to errors, misuse or mishandling during the
design, production, or use. Extrinsic causes often lead to
systematic failures,