2016 3rd International Conference on Information Science and Control Engineering
1413
Simulation and design of organic RFID based on
dual-gate OFET
Shu Shen*, Lijuan Sun, Ruchuan Wang, Lei Gu
School of Computer Science & Technology, Nanjing University of Posts and Telecommunications, Nanjing, China
Jiangsu High Technology Research Key Laboratory for Wireless Sensor Network
Contacting Email: shens@njupt.edu
Abstract—A dual-gate OFET model and its multi-platform
analog/digital active library of organic RFID is presented. The
zero-V
GS
inverters implemented by dual-gate OFET and single
gate OFET are discussed and analyzed, as well as two
architectures of the dual-gate OFET inverter are presented,
which shows the dual-gate OFET model improving the
performances of the inverter such as larger noise margin and
higher gain. Furthermore, the simulations of ring oscillator and
full RFID tag system by different inverter implementations are
compared and discussed. The dual-gate OFET solution can
provide a post-fabrication tunability to optimize the clock
frequency and tag data rate in some extent.
Keywords-RFID; Dual-gate; OFET; Inverter; Ring Oscillator
I. INTRODUCTION
In recent years, Radio Frequency identification (RFID)
systems, are increasingly gaining attention from both academia
and industries thanks to their great potential in detecting and
tracking. In fact, the range of applications of RFID tags,
starting from the traditional markets of ticketing and supply
chain management, is rapidly growing. This trend is
emphasized for low-cost RFID systems. On the contrary, RFID
of low-price, high-volume products based on conventional
fabrication technologies, has added costs that cannot be
sustained. In this framework, a promising solution, compatible
with the expected product cost, is given by the Organic Field
Effect Transistor (OFET) technology (also called, more
specifically, Organic Thin Film Transistor, OTFT). The only
way to obtain the required cost reduction, with respect to
conventional technologies, is to achieve a full integration of the
organic RFID, including a single substrate, the coupling
(radiating) elements, the analog, digital, and energy harvesting
sections. To carry out such an integrated implementation, a
reliable, accurate and easy to use simulation library, which is
tailored for organic based printed circuits, and able to handle
digital and analog subsystems, would be of great help to the
designers. Nowadays, the mainstream technology is still single
gate p-type only OFET, with intrinsic limitations about
integration of larger circuits, as a result of parameter variability.
To overcome these troubles, some research groups were
starting to study dual-gate technology in these years [1,2]. In
this work, we present a dual-gate p-type OFET technology,
which is more convenient to improve the robustness of organic
circuits.
The SPICE RFID library, which was extended to the
platform Agilent ADS and optimizing by a physics-based
model specific to OFET, has already been presented in
previous work by our group [3,4,5]. In this paper, the library is
tailored and modified in order to adapt the behavior of the dual-
gate OFET.
The paper is organized as follows: Section II provides the
organic technology issues, focusing on the dual-gate OFET
modeling strategy. Section III presents two architectures of
zero-V
GS
inverter with dual-gate and compares their behaviors
with single gate zero-V
GS
inverter’s. The simulations of ring
oscillator and an 8-bit RFID system are demonstrated and
discussed in Section IV. Finally, some conclusions are drawn
in Section V.
II. DUAL-GATE OFET
The threshold voltage (V
T
) is an important parameter that
has a strong effect on the noise margin of an organic inverter.
For the OFET with a given gate, the threshold voltage is fixed
normally. In order to tune the threshold voltage independently,
a second gate is applied [6,7]. The dual-gate transistor’s
configuration, which combines a single semiconductor layer,
top and bottom gate dielectrics, and shares source and drain
electrodes is shown in 错误!未找到引用源。.
Fig.1. cross-section of the dual-gate OFET.
In literatures studying the transfer curve of the dual-gate
OFET [1,8,9,10,11], it was found that the dependence of the
threshold voltage of the bottom-gate transistor is similarly
defined by the top-gate bias. In the first order approximation,
the threshold voltage (V
T
) can be described as a function of top-
gate bias according to Equation (1):