ARCTURUS laser system 3
the laser system, the contrast is controlled by saturable
absorbers, Pockels cells and, recently, by an XPW module.
Most of temporal profile quality of the output pulses is
defined at this stage. The second contrast improvement is
achieved by a single plasma mirror system, which can be
inserted in each of the main beam paths after the compressor.
Before the XPW module implementation, the intrinsic
laser contrast was limited by the regenerative amplifier to
∼3 × 10
−7
at 12 ns (the regen roundtrip) and it could be
improved up to 6×10
−8
when a saturable absorber (SA) was
inserted after the regenerative cavity. For the configuration
when the SAs were present in both the regen and booster
amplifiers, the contrast on a 400 ps time scale before the
pulse peak was measured with a SEQUOIA third-order
auto-correlator; the recorded temporal profile is shown in
Figure 2(a) as the green trace. On the time axis, negative
values correspond to the time interval prior to the peak of
the main laser pulse. For comparison, the blue trace shows
the temporal profile obtained in a configuration when the SA
from the booster amplifier was bypassed.
2.2. Cross-polarized wave filter
The XPW module is based on the third-order nonlinear
effect of cross-polarized wave generation (XPW) in a BaF
2
crystal
[24]
. In the module, the compressed pulse with an
energy of about 1 mJ is focused with a high-F-number lens
through a hollow fiber for spatial filtering onto the XPW-
crystal placed in an evacuated tube. From the incoming
linearly polarized wave, a wave of the same frequency,
but with a perpendicular polarization, is created. Hereby,
the intensity of the cross-polarized wave is proportional to
the third power of the input intensity and, thus, the pulse
pedestal can be drastically reduced. One should note that the
XPW module is placed between a pair of polarizers and the
temporal contrast performance is limited by the extinction
ratio of the polarizing elements. With the XPW module, the
contrast ratio in the case of our laser system is improved by
three orders of magnitude, with an efficiency of about 10%,
and the pulse spectrum is broadened by a factor ∼1.7 to
about 60 nm
[20]
.
The contribution of the XPW module to the beam temporal
profile was studied. In the double-CPA architecture, the laser
pulse was firstly temporally characterized by bypassing the
XPW module and removing the SA after regen 2, in the so-
called low-contrast configuration (red trace in Figure 2(b)).
In this case, the ASE contrast was better than 10
−9
at 100 ps
and around 10
−8
at 10 ps, while at 1 ps before the laser pulse
maximum, the contrast was 10
−4
. After the first CPA unit,
the beam was guided through the XPW module and the ASE
contrast for hundreds of picoseconds before the peak was
improved by three orders of magnitude to 10
−12
(blue trace).
For this measurement, in the time interval between −75 and
−15 ps, the efficiency of the pedestal cleaning decreases,
Figure 2. SEQUOIA measurements of the ARCTURUS laser system
showing the effect of different optical elements on the contrast
improvement. The traces in (a) show the effect of the SA in the booster
amplifier in a single-CPA configuration. In (b), a series of measurements
indicates the influence of the XPW module and the effect of the regen 2 SA
on the contrast enhancement in the double-CPA configuration. The traces
in (c) show the present contrast quality for all three beams: both HP pulses
(beam 1 and beam 2) and the probe beam.
resulting in a drop in contrast from 10
−12
to 10
−8
. By
additionally inserting the SA after the regen 2, the temporal
profile improves to 10
−12
at about 40 ps before the main
pulse, while the rising edge of the pulse ramps up by five