Data Sheet 6 Rev. 1.2
2018-04-26
LITIX™ Basic
TLD1124EL
General Product Characteristics
4 General Product Characteristics
4.1 Absolute Maximum Ratings
Note: Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Note: Integrated protection functions are designed to prevent IC destruction under fault conditions described in
the data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions
are not designed for continuous repetitive operation.
Absolute Maximum Ratings
1)
T
j
= -40°C to +150°C; all voltages with respect to ground, positive current flowing into pin for input pins (I), positive
currents flowing out of the I/O and output pins (O) (unless otherwise specified)
1) Not subject to production test, specified by design
Pos. Parameter Symbol Limit Values Unit Conditions
Min. Max.
Voltages
4.1.1 Supply voltage
V
S
-16 40 V –
4.1.2 Diagnosis enable voltage DEN
V
DEN
-16 40 V –
4.1.3 Diagn. enable voltage DEN related to
V
S
V
DEN(VS)
V
S
- 40 V
S
+ 16 V –
4.1.4 Diagn. enable voltage DEN related to
V
OUT
V
DEN
- V
OUT
V
DEN
-
V
OUT
-16 40 V –
4.1.5 Output voltage
V
OUT
-1 40 V –
4.1.6 Power stage voltage
V
PS
= V
S
- V
OUT
V
PS
-16 40 V –
4.1.7 IN_SET voltage
V
IN_SET
-0.3 6 V –
4.1.8 Status voltage
V
ST
-0.3 6 V –
Currents
4.1.9 IN_SET current
I
IN_SET
–
–
2
8
mA –
Diagnosis output
4.1.10 Output current
I
OUT
– 390 mA –
Temperatures
4.1.11 Junction temperature
T
j
-40 150 °C –
4.1.12 Storage temperature
T
stg
-55 150 °C –
ESD Susceptibility
4.1.13 ESD resistivity to GND
V
ESD
-2 2 kV Human Body Model
(100 pF via 1.5 k
Ω)
2)
2) ESD susceptibility, Human Body Model “HBM” according to ANSI/ESDA/JEDEC JS-001-2011
4.1.14 ESD resistivity all pins to GND V
ESD
-500 500 V CDM
3)
3) ESD susceptibility, Charged Device Model “CDM” according to JESD22-C101E
4.1.15 ESD resistivity corner pins to GND V
ESD
-750 750 V CDM
3)
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