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LIN
Conformance Test Specification
Package for LIN 2.1
October 10
th
, 2008
Website: www.lin-subbus.org Contact: info@lin-subbus.org
LIN
Conformance Test Specification Package for LIN 2.1
For the LIN Specification Package
Revision 2.1 (November 24
th
, 2006)
October 10
th
, 2008
© LIN Consortium, 2008
This specification as released by the LIN Consortium is intended for the purpose of
information only and is provided on an "AS IS" basis only and cannot be the basis for
any claims. The LIN Consortium will not be liable for any use of this Specification.
This Document must be regarded as strictly LIN Consortium Internal and must not be
distributed outside the LIN Consortium. The use is restricted for the assignee, his col-
leagues, and employees of any affiliates of his company.
The unauthorized use, e.g. copying, displaying or other use of any content from this
document is a violation of the law and intellectual property rights.
LIN is a registered Trademark ®. All rights reserved.
All distributions are registered.
Registered copy for frank.liesaus@temic.com
LIN
Conformance Test Specification
Package for LIN 2.1
October 10
th
, 2008
Website: www.lin-subbus.org Contact: info@lin-subbus.org
Registered copy for frank.liesaus@temic.com
LIN
Conformance Test Specification
OSI Layer 1 – Physical Layer
Version 2.1
October 10
th
, 2008; Page
1
Website: www.lin-subbus.org Contact: info@lin-subbus.org
LIN
Conformance Test Specification
LIN OSI Layer 1 – Physical Layer
For LIN devices with Rx and Tx access
For the LIN Physical Layer Specification
Revision 2.1 (November 24
th
, 2006)
Version 2.1
October 10th, 2008
Registered copy for frank.liesaus@temic.com
Table of Contents
LIN
Conformance Test Specification
OSI Layer 1 – Physical Layer
Version 2.1
October 10
th
, 2008; P
age
2
Website: www.lin-subbus.org Contact: info@lin-subbus.org
Table of contents
LIN OSI LAYER 1 – PHYSICAL LAYER 1
1
TEST SPECIFICATION OVERVIEW 3
1.1
Test Case Organisation......................................................................................................... 3
1.2
Symbols and Abbreviated Terms .......................................................................................... 4
1.3
Measurement and Signal Generation – Requirements ......................................................... 4
2
OPERATIONAL CONDITIONS – CALIBRATION 5
2.1
Operating Voltage Range ...................................................................................................... 6
2.2
Threshold Voltages................................................................................................................ 7
2.2.1 IUT as Receiver: V
SUP
@ V
BUS_DOM
(down)......................................................................................................... 7
2.2.2 IUT as Receiver: V
SUP
@V
BUS_ REC
(up) .............................................................................................................. 8
2.2.3 IUT as Receiver: V
SUP
@V
BUS
............................................................................................................................. 9
2.3
Variation of V
SUP_NON_OP
∈ [- 0.3V ... 7.0V], [18V … 40V].................................................... 10
2.4
I
BUS
Under Several Conditions............................................................................................. 11
2.4.1 I
BUS_LIM
@ Dominant State ( Driver On )............................................................................................................ 11
2.4.2 I
BUS_PAS_dom
: IUT in Recessive State : V
BUS
= 0V............................................................................................... 12
2.4.3 I
BUS_PAS_rec
: IUT in Recessive State : V
SUP
= 7.0V with Variation of V
BUS
∈ [8.0V .. 18V].................................... 13
2.5
Slope Control....................................................................................................................... 14
2.5.1 Measuring the Duty Cycle @ 10.4 kBit/sec – IUT as Transmitter ..................................................................... 14
2.5.2 Measuring the Duty Cycle @ 20.0 kBit/sec – IUT as Transmitter ..................................................................... 16
2.6
Propagation Delay ............................................................................................................... 18
2.6.1 Propagation Delay of the Receiver................................................................................................................... 18
2.7
GND / V
BAT
Shift Test – Dynamic ........................................................................................ 19
2.7.1 GND Shift Test – Dynamic – IUT as Transceiver ............................................................................................. 20
2.7.2 GND Shift Test – Dynamic – IUT as Transceiver ............................................................................................. 20
2.7.3 V
BAT
Shift Test – Dynamic – IUT as Transceiver............................................................................................... 21
2.7.4 V
BAT
Shift Test – Dynamic – IUT as Transceiver............................................................................................... 21
2.8
Failure.................................................................................................................................. 22
2.8.1 Loss of Battery................................................................................................................................................. 22
2.8.2 Loss of GND.................................................................................................................................................... 23
3
STATIC TEST CASES 24
4
REFERENCES 27
Registered copy for frank.liesaus@temic.com
Test Specification
overview
LIN
Conformance Test Specification
OSI Layer 1 – Physical Layer
Version 2.1
October 10
th
, 2008; Page
3
Website: www.lin-subbus.org Contact: info@lin-subbus.org
1 Test Specification overview
1.1 Test Case Organisation
The intention of each test case is described at first, with a short textual explanation.
Before tests are executed the test system must be set to its initial state as described in chap-
ter 2.
The test procedure and the expected results are described in the form of a chart for each test
case. The table below is a typical test description.
IUT node as
Test for master, slave or
both
Corresponding test number
Initial State
Parameters:
Number of nodes
Bus loads
Operational Conditions:
IUT Mode
TX Signal
RX Signal
V
BAT
,V
SUP
,V
IUT
Failure
GND Shift
Number of node in the test implementation
In order to simulate a LIN network
Operation Mode for the IUT (e.g. normal mode, low
power mode,...)
State of TX pin at the beginning of the test
Logical output voltages of the Rx pin corresponding to reces-
sive/dominant level at the LIN pin are taken from the data
sheet of the IUT.
Value in Volt
In order to set failure at
Value in Volt
Test Steps
Describe the test stages.
Response
Describe the result expected in order to decide if the test passed or failed
Reference
Corresponding no. in the LIN Physical Layer Specification
Remark:
IUT can be a master or slave ECU or an individual transceiver chip. The Rx, Tx and V
SUP
signals must be accessible for proper test execution. It is recommended to test with Rx/Tx
access, if not possible testing according the specification without Rx/Tx access is accepted.
Depending on the type of IUT the supply voltage is V
BAT
for ECU or V
SUP
for a chip – called
V
IUT
in this description.
Registered copy for frank.liesaus@temic.com
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