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Datasheet 7 1.0
2017-12-07
TLE94004EP
General Product Characteristics
3 General Product Characteristics
3.1 Absolute Maximum Ratings
Notes
1. Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
2. Integrated protection functions are designed to prevent IC destruction under fault conditions described in the
data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are
not designed for continuous repetitive operation.
Table 2 Absolute Maximum Ratings
1)
T
j
= -40°C to +150°C
1) Not subject to production test, specified by design
Parameter Symbol Values Unit Note or
Test Condition
Number
Min. Typ. Max.
Voltages
Supply voltage V
S
-0.3 – 40 V P_4.1.1
Supply Voltage Slew Rate | dV
S
/dt | ––10V/µsV
S
increasing and
decreasing
1)
P_4.2.2
Power half-bridge output voltage V
OUT
-0.3 – 40 V 0 V < V
OUT
< V
S
P_4.1.2
Logic supply voltage V
DD
-0.3 – 5.5 V 0 V < V
S
< 40 V P_4.1.3
Logic input voltages
(EN1, EN2, IN1, IN2, IN3, IN4)
V
ENn
, V
INn
-0.3 – VDD V 0 V < V
S
< 40 V
0 V < V
DD
< 5.5V
P_4.1.16
Logic output voltage
(EF)
V
EF
-0.3 – VDD V 0 V < V
S
< 40 V
0 V < V
DD
< 5.5V
P_4.1.17
Currents
Continuous Supply Current for V
S
I
S
0–2.0A– P_4.1.20
Current per GND pin I
GND
0–2.0A– P_4.1.14
Output Currents I
OUT
-2.0 – 2.0 A – P_4.1.15
Temperatures
Junction temperature T
j
-40 – 150 °C – P_4.1.8
Storage temperature T
stg
-50 – 150 °C – P_4.1.9
ESD Susceptibility
ESD susceptibility OUTn and VS pins
versus GND. All other pins
grounded.
V
ESD
-4 – 4 kV JEDEC HBM
1)2)
2) ESD susceptibility, “JEDEC HBM” according to ANSI/ ESDA/ JEDEC JS001 (1.5 kΩ, 100pF)
P_4.1.10
ESD susceptibility all pins V
ESD
-2 – 2 kV JEDEC HBM
1)2)
P_4.1.11
ESD susceptibility all pins V
ESD
-500 – 500 V CDM
1)3)
3) ESD susceptibility, Charged Device Model “CDM” according JEDEC JESD22-C101
P_4.1.12
ESD susceptibility corner pins V
ESD
-750 – 750 V CDM
1)3)
P_4.1.13