ATPG 生成的pattern

ATPG生成的pattern是通过使用ATPG工具来确定故障和产生测试向量。在ATPG中，可以使用set_gate_report命令来设置要报告的门，其中0表示模式索引。然后，可以使用report_gates命令查看SDFF期望的值。

值得注意的是，ATPG生成的pattern可以分为几种类型，例如Basic Scan Patterns、Clock PO Patterns、Clock Sequential Patterns和Testing Around RAMS等。每种类型都有不同的应用场景和测试目标。<span class="em">1</span><span class="em">2</span><span class="em">3</span>
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