stm32h750 flash timeout reset the target and try it again

### STM32H750 Flash Operation Timeout Reset Solution

For the STM32H750, when encountering a flash operation timeout leading to resets during programming or erase operations on the internal flash memory, several factors and solutions can be considered.

The issue of timeouts often arises from incorrect configuration settings related to wait states for the flash access. The number of wait states must match the system clock frequency; otherwise, this mismatch may cause read/write failures that lead to time-outs[^1]. To address these issues:

#### Adjusting Wait States Configuration
Ensure proper adjustment of FLASH_ACR register values which control parameters like latency (wait states). For higher frequencies, more wait states are required to prevent timing violations within the flash memory interface.

// Example C code snippet adjusting FLASH ACR Register
FLASH->ACR &= ~(FLASH_ACR_LATENCY_Msk);
FLASH->ACR |= FLASH_ACR_LATENCY_7WS;

#### Disabling Prefetch Buffer Temporarily During Operations
Disabling prefetch buffer temporarily while performing critical flash operations might help avoid potential conflicts between instruction fetches and data accesses occurring simultaneously over the same bus lines used by both CPU instructions execution pipeline as well as direct RAM/Flash transactions initiated through HAL functions calls.

// Disable Prefetch Buffer before Flash Operation
HAL_FLASH_Unlock();
__HAL_FLASH_INSTRUCTION_CACHE_DISABLE();  
__HAL_FLASH_DATA_CACHE_DISABLE();

// Perform your flash operation here...

// Re-enable after completion
__HAL_FLASH_INSTRUCTION_CACHE_ENABLE();
__HAL_FLASH_DATA_CACHE_ENABLE();
HAL_FLASH_Lock();

#### Increasing Timeouts in Code
Increasing software-imposed delays or loop counters inside drivers responsible for managing low-level hardware interactions with non-volatile storage components could give enough margin against race conditions causing premature terminations due to perceived stalls at runtime level without actual faults present physically inside silicon itself.

By implementing above adjustments carefully based upon specific application requirements alongside thorough testing across different operating scenarios including temperature variations affecting electrical characteristics significantly one should achieve stable performance free from unexpected interruptions caused by improper handling of embedded systems' persistent memories interfaces.

--related questions--

1. What other common problems occur with STM32H7 series microcontrollers?
2. How does changing the number of wait states impact overall system performance?
3. Can disabling the prefetch buffer affect program execution speed negatively?
4. Are there any best practices for writing robust flash driver implementations?
5. In what ways do environmental factors influence microcontroller behavior?