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Accelerate test throughput with industry-leading
specifications
Shaving seconds or even milliseconds off a test time can lead to significant savings for
high-volume manufacturers, making throughput gains a never-ending quest for test system
designers. The RP7900 is a valuable tool for increasing throughput. It provides fast output
speed, sub-millisecond command-processing time (≤ 1 ms), and output list that can help you
achieve significant throughput gains in your testing.
Accurately characterize your DUT’s power profile with
advanced measurements
The RP7900 provides simultaneous voltage and current measurement capabilities that deliver
high accuracy and resolution. Make measurements using two main modes: averaged or digitized.
In average mode, the RP7900 delivers high accuracy voltage and current measurements. The
digitizing capability allows you to capture dynamic current or voltage profiles.
In addition to high-accuracy voltage and current measurement capabilities, the RP7900
Series regenerative power system offer built-in power, peak power, amp-hour, and watt-hour
calculations. These measurements help simplify your power efficiency and storage calculations.
Avoid damage to your DUT
When you are testing costly DUTs, integrating power protection measures into the test system
is critical. Using instrumentation with built-in or integrated protection features provides a huge
benefit when DUT protection is required. With protection measures implemented in hardware
rather than test system software, error conditions can be detected and handled much faster,
reducing the likelihood of the DUT sustaining major damage. The RP7900 provides built-in
over-voltage, over-current, and over-temperature protection. For even greater DUT protection,
use the accessory SD1000A Safety Disconnect System that was exclusively designed to work
with the RP795x and RP796x Series to handle faults and ensure the output is secured with a
redundant safety disconnect system.
Generate voltage and current transients
DUTs that are operated in rugged environments, such as automotive electronics and avionics, can
often experience transient behavior from the power source, such as voltage dropouts or surges. To
ensure your DUT can stand up to these real-world transients, you must simulate worst-case power
transient conditions in the test process. The RP7900 provide three different functionalities for
simulating either voltage or current transients for testing (not supported in master/slave mode):
Step: One-time event that steps the output voltage or current up or down in response to a
triggered event.
Constant dwell arbitrary waveforms: An arbitrary waveform generator (ARB) allows you to
generate complex user-defined voltage or current waveforms of up to 65,535 data points. One
dwell setting applies for the entire ARB, from 10.24 μs to 0.30 seconds.
List: A list can consist of up to 512 steps. Each step in the list can have a unique dwell time
associated with it, which specifies the time in seconds that the list will remain at that step before
moving on to the next step. Lists can also be trigger-paced, in which case the list advances one
step for each trigger received.