The document VW80808-2 中文 2017.pdf provides guidelines for the test program development process for IC products. It emphasizes the importance of documentation and traceability in ensuring the quality and reliability of the delivered products. The documentation of the test program development process must be made available to the purchaser upon request, and it must demonstrate a clear link and forward and backward traceability between the test revision and the delivered products.
One of the key requirements outlined in the document is the electrical function check at various temperature conditions. At the start of production of IC products, the electrical function check must be conducted at high temperature (critical upper temperature), room temperature (as per VW 80000), and low temperature (critical lower temperature). This is crucial for ensuring the performance and reliability of the IC products under different thermal conditions.
It is important to note that these requirements apply to new IC products. When developing test programs for new IC products, it is essential to comply with the guidelines outlined in VW80808-2 中文 2017.pdf. In addition to the electrical function check at different temperature conditions, the document may contain further guidelines and specifications for the test program development process.
Overall, VW80808-2 中文 2017.pdf serves as a valuable resource for ensuring the quality and reliability of IC products through the rigorous test program development process. Adherence to the guidelines outlined in the document is essential for meeting the quality standards and requirements set forth by the purchaser. By following these guidelines, IC manufacturers can ensure that their products meet the highest standards of performance and reliability.
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