Tessent® TestKompress® User’s Manual, v2020.2
17
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Chapter 1
Getting Started
This manual describes how to integrate Tessent
®
TestKompress
®
into your design process.
More information can be found in the following manuals:
• Tessent Shell Reference Manual — Contains information on Tessent TestKompress
commands and information for all DRCs including the Tessent TestKompress-specific
EDT Rules.
• Tessent Shell User’s Manual — Contains information about the Tessent Shell
environment in which you use Tessent TestKompress.
For a complete list of Mentor Graphics Tessent-specific terms, including Tessent
TestKompress-specific terms, refer to the Tessent Glossary.
Tessent TestKompress. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
EDT Technology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Scan Channels. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Structure and Function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Test Patterns . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
TestKompress Compression Logic. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
TestKompress Usage Flow Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
EDT IP Creation and Pattern Generation Flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Pre-Synthesis Flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Tessent Core Description (TCD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
EDT IP Generation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
EDT Logic Synthesis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
EDT Pattern Generation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Using TCD-Based Flow With Flattened EDT Hierarchy. . . . . . . . . . . . . . . . . . . . . . . . . . 36
Tessent Shell User Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Tessent TestKompress
Tessent TestKompress is a Design-for-Test (DFT) product that creates test patterns and
implements compression for the testing of manufactured ICs. Advanced compression reduces
ATE memory and channel requirements and reduced data volume results in shorter test
application times and higher tester throughput than with traditional ATPG. TestKompress also
supports traditional ATPG.
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