设计测试方法及数字IC和嵌入式核心系统的测试实例分析

Design-for-test (DFT) is an essential aspect of designing digital integrated circuits (IC's) and embedded core systems. In the book "Design-for-Test for Digital IC's and Embedded Core Systems" by Alfred L. Crouch, the author explores the fundamentals of test and the importance of incorporating DFT techniques in the design process. The first chapter of the book introduces the concept of test and the need for DFT in the development of digital IC's and embedded core systems. It highlights the relationship between the cost of a product and test engineering, emphasizing the importance of efficient testing to reduce overall costs. The chapter also emphasizes the need for concurrent test engineering, which involves planning and implementing test strategies alongside the design process. The chapter further defines testing and outlines its objectives. It explains that testing is a process of evaluating the functionality and quality of a product, ensuring that it meets the desired specifications. The importance of measurement criteria, such as accuracy, reliability, and efficiency, is also discussed. Fault modeling is another important aspect covered in this chapter. It involves creating models that represent potential faults or errors in a circuit, which helps in identifying and diagnosing issues during testing. The book provides insight into different fault models and how they can be used to enhance the efficiency of the testing process. Overall, the chapter sets the foundation for understanding the significance of DFT in the design and testing of digital IC's and embedded core systems. It emphasizes the need for a comprehensive approach that considers testing strategies from the early stages of the design process. Incorporating DFT techniques ensures that the final product is thoroughly tested, reliable, and meets the desired specifications.