Keil5 Low Voltage Reliability Test Practical Tips

# Introduction to Keil5 Low Voltage Reliability Testing

Keil5 low voltage reliability testing is a technique used to verify the reliability of electronic systems under low voltage conditions. It aims to assess whether the system can function properly in a low voltage environment and identify potential risks of low voltage failure. Low voltage reliability testing is crucial for ensuring the stability and reliability of electronic systems in practical applications, especially in battery-powered devices or low voltage operating environments.

# The Theory of Low Voltage Reliability Testing

### 2.1 Mechanisms of Low Voltage Failure

Low voltage failure refers to malfunctions or performance degradation of integrated circuits (ICs) when operating below their rated voltage. This failure is mainly caused by the following mechanisms:

***Electromigration:** When current passes through metal wires, metal atoms migrate from high potential areas to low potential areas, causing wire fractures or increased resistance.
***Time-Dependent Dielectric Breakdown (TDDB):** At low voltages, the electric field strength in the dielectric layer is high. Over time, the dielectric layer gradually breaks down, resulting in short circuits or increased leakage current.
***Negative Bias Temperature Instability (NBTI):** Under low voltage and high-temperature conditions, the threshold voltage of MOSFETs increases over time, leading to a decrease in device performance.
***Positive Bias Temperature Instability (PBTI):** Similar to NBTI, PBTI occurs when the gate voltage of MOSFETs is positive, causing a decrease in threshold voltage.
***Latching:** When the parasitic bipolar transistors in CMOS devices are triggered, latching occurs, causing the device to malfunction.

### 2.2 Methods of Low Voltage Reliability Testing

To evaluate the low voltage reliability of ICs, the following testing methods can be used:

***Constant Voltage Stress (CVS):** Maintain the device at a constant low voltage and monitor changes in its electrical parameters.
***Time-Varying Voltage Stress (TVS):** Expose the device to a low voltage that changes over time, such as a sinusoidal or square wave.
***Temperature Cycling:** Perform temperature cycling on the device under low voltage to accelerate failure mechanisms.
***Electromigration:** Expose the device to high current densities to induce electromigration failure.
***TDDB:** Expose the device to high electric field strengths to induce dielectric layer breakdown.

Through these testing methods, the risk of failure at low voltage conditions can be assessed, and appropriate measures can be taken to improve reliability.

# Setting Up Keil5 Low Voltage Testing Environment

**Hardware Environment**

- Oscilloscope: Used to measure power supply voltage and current.
- Power Supply: A power supply capable of providing adjustable output voltage.
- Load: Resistors or load equipment that simulate actual working loads.
- Device Under Test (DUT): The device to be tested.

**Software Environment**

- Keil5 Integrated Development Environment (IDE): Used to write and compile test programs.
- Keil5 Simulator: Used to debug and control the DUT.
- Test Scripts: Script files used to automate the testing process.

**Steps to Set Up the Testing Environment**

1. **Connect the Hardware:** Connect the DUT, power supply, load, and oscilloscope.
2. **Configure the Power Supply:** Set the output voltage of the power su